Application of single-crystal CVD diamond and SiC detectors for diagnostics of ion emission from laser plasmas

L. Ryc, L. Calcagno, F. Dubecky, D. Margarone, T. Nowak, P. Parys, M. Pfeifer, F. Riesz, L. Torrisi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The application of single-crystal CVD diamond and SiC detectors for the measurement of ions generated from laser-produced plasmas is reported. It was found that detectors are mostly sensitive to fast ions and protons. Optimization of the diagnostic system based on the detectors is discussed.

Original languageEnglish
Title of host publicationASDAM 2012 - Conference Proceedings
Subtitle of host publicationThe 9th International Conference on Advanced Semiconductor Devices and Microsystems
Pages255-258
Number of pages4
DOIs
Publication statusPublished - Dec 1 2012
Event9th International Conference on Advanced Semiconductor Devices and Microsystems, ASDAM 2012 - Smolenice, Slovakia
Duration: Nov 11 2012Nov 15 2012

Publication series

NameASDAM 2012 - Conference Proceedings: The 9th International Conference on Advanced Semiconductor Devices and Microsystems

Other

Other9th International Conference on Advanced Semiconductor Devices and Microsystems, ASDAM 2012
CountrySlovakia
CitySmolenice
Period11/11/1211/15/12

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ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

Ryc, L., Calcagno, L., Dubecky, F., Margarone, D., Nowak, T., Parys, P., Pfeifer, M., Riesz, F., & Torrisi, L. (2012). Application of single-crystal CVD diamond and SiC detectors for diagnostics of ion emission from laser plasmas. In ASDAM 2012 - Conference Proceedings: The 9th International Conference on Advanced Semiconductor Devices and Microsystems (pp. 255-258). [6418519] (ASDAM 2012 - Conference Proceedings: The 9th International Conference on Advanced Semiconductor Devices and Microsystems). https://doi.org/10.1109/ASDAM.2012.6418519