Application of combined micro-proton-induced X-ray emission and micro-synchrotron radiation X-ray fluorescence techniques for the characterization of impact materials around Barringer Meteor Crater

I. Uzonyi, Gy Szöor, B. Vekemans, L. Vincze, P. Rózsa, Gy Szabó, A. Somogyi, F. Adams, Á Z. Kiss

Research output: Contribution to journalConference article

7 Citations (Scopus)

Abstract

A combined micro-PIXE and micro-SRXRF method has been used for the characterization of impact materials collected at the well-known Barringer Meteor Crater. Elemental maps were recorded and concentrations were determined by micro-PKE method for the major constituents of samples. Micro-SRXRF technique was used for the complementary measurement of medium and high atomic number elements, especially the siderophilic ones. Altogether, approximately 40 elements were analyzed. These results elucidate many steps of the formation mechanism of the various impact-metamorphosed objects.

Original languageEnglish
Pages (from-to)1717-1723
Number of pages7
JournalSpectrochimica Acta - Part B Atomic Spectroscopy
Volume59
Issue number10-11
DOIs
Publication statusPublished - Oct 8 2004
Event17th International Congress on X-Ray Optics and Microanalysis - Chamonix, Mont Blanc, France
Duration: Sep 22 2003Sep 26 2003

Keywords

  • Barringer Meteor Crater
  • Impact materials
  • Micro-PIXE
  • Micro-SRXRF

ASJC Scopus subject areas

  • Analytical Chemistry
  • Atomic and Molecular Physics, and Optics
  • Instrumentation
  • Spectroscopy

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