Application limits of runaway electron modeling based on analytical formulas of generation and loss rates

G. I. Pokol, R. Lohner, G. Papp, B. Erdos

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication42nd European Physical Society Conference on Plasma Physics, EPS 2015
PublisherEuropean Physical Society (EPS)
Publication statusPublished - 2015
Event42nd European Physical Society Conference on Plasma Physics, EPS 2015 - Lisbon, Portugal
Duration: Jun 22 2015Jun 26 2015

Other

Other42nd European Physical Society Conference on Plasma Physics, EPS 2015
CountryPortugal
CityLisbon
Period6/22/156/26/15

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Pokol, G. I., Lohner, R., Papp, G., & Erdos, B. (2015). Application limits of runaway electron modeling based on analytical formulas of generation and loss rates. In 42nd European Physical Society Conference on Plasma Physics, EPS 2015 European Physical Society (EPS).