Analyzing numerical optimization problems of finite resolution sine wave fitting algorithms

B. Renczes, I. Kollár, P. Carbone, A. Moschitta, V. Palfi, T. Virosztek

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

In this paper the numerical behavior of different sine wave fitting methods is investigated. In addition to the Three- and Four-Parameter Least Squares Fits, also the Maximum Likelihood and the Quantile Based Estimator methods suffer from similar numerical problems that may disturb the result of the ADC test. Suggestions are given in order to improve the performance of the investigated algorithms.

Original languageEnglish
Title of host publicationConference Record - IEEE Instrumentation and Measurement Technology Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1662-1667
Number of pages6
Volume2015-July
ISBN (Print)9781479961139
DOIs
Publication statusPublished - Jul 6 2015
Event2015 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2015 - Pisa, Italy
Duration: May 11 2015May 14 2015

Other

Other2015 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2015
CountryItaly
CityPisa
Period5/11/155/14/15

Fingerprint

Maximum likelihood

Keywords

  • Analog-digital converter testing
  • Least squares fit
  • Maximum likelihood method
  • Numerical optimization
  • Quantile based estimator
  • Sine wave fitting

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Renczes, B., Kollár, I., Carbone, P., Moschitta, A., Palfi, V., & Virosztek, T. (2015). Analyzing numerical optimization problems of finite resolution sine wave fitting algorithms. In Conference Record - IEEE Instrumentation and Measurement Technology Conference (Vol. 2015-July, pp. 1662-1667). [7151529] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/I2MTC.2015.7151529

Analyzing numerical optimization problems of finite resolution sine wave fitting algorithms. / Renczes, B.; Kollár, I.; Carbone, P.; Moschitta, A.; Palfi, V.; Virosztek, T.

Conference Record - IEEE Instrumentation and Measurement Technology Conference. Vol. 2015-July Institute of Electrical and Electronics Engineers Inc., 2015. p. 1662-1667 7151529.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Renczes, B, Kollár, I, Carbone, P, Moschitta, A, Palfi, V & Virosztek, T 2015, Analyzing numerical optimization problems of finite resolution sine wave fitting algorithms. in Conference Record - IEEE Instrumentation and Measurement Technology Conference. vol. 2015-July, 7151529, Institute of Electrical and Electronics Engineers Inc., pp. 1662-1667, 2015 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2015, Pisa, Italy, 5/11/15. https://doi.org/10.1109/I2MTC.2015.7151529
Renczes B, Kollár I, Carbone P, Moschitta A, Palfi V, Virosztek T. Analyzing numerical optimization problems of finite resolution sine wave fitting algorithms. In Conference Record - IEEE Instrumentation and Measurement Technology Conference. Vol. 2015-July. Institute of Electrical and Electronics Engineers Inc. 2015. p. 1662-1667. 7151529 https://doi.org/10.1109/I2MTC.2015.7151529
Renczes, B. ; Kollár, I. ; Carbone, P. ; Moschitta, A. ; Palfi, V. ; Virosztek, T. / Analyzing numerical optimization problems of finite resolution sine wave fitting algorithms. Conference Record - IEEE Instrumentation and Measurement Technology Conference. Vol. 2015-July Institute of Electrical and Electronics Engineers Inc., 2015. pp. 1662-1667
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