Analyzing numerical optimization problems of finite resolution sine wave fitting algorithms

B. Renczes, I. Kollar, P. Carbone, A. Moschitta, V. Palfi, T. Virosztek

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

In this paper the numerical behavior of different sine wave fitting methods is investigated. In addition to the Three- and Four-Parameter Least Squares Fits, also the Maximum Likelihood and the Quantile Based Estimator methods suffer from similar numerical problems that may disturb the result of the ADC test. Suggestions are given in order to improve the performance of the investigated algorithms.

Original languageEnglish
Title of host publication2015 IEEE International Instrumentation and Measurement Technology Conference - The "Measurable" of Tomorrow
Subtitle of host publicationProviding a Better Perspective on Complex Systems, I2MTC 2015 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1662-1667
Number of pages6
ISBN (Electronic)9781479961139
DOIs
Publication statusPublished - Jul 6 2015
Event2015 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2015 - Pisa, Italy
Duration: May 11 2015May 14 2015

Publication series

NameConference Record - IEEE Instrumentation and Measurement Technology Conference
Volume2015-July
ISSN (Print)1091-5281

Other

Other2015 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2015
CountryItaly
CityPisa
Period5/11/155/14/15

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Keywords

  • Analog-digital converter testing
  • Least squares fit
  • Maximum likelihood method
  • Numerical optimization
  • Quantile based estimator
  • Sine wave fitting

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Renczes, B., Kollar, I., Carbone, P., Moschitta, A., Palfi, V., & Virosztek, T. (2015). Analyzing numerical optimization problems of finite resolution sine wave fitting algorithms. In 2015 IEEE International Instrumentation and Measurement Technology Conference - The "Measurable" of Tomorrow: Providing a Better Perspective on Complex Systems, I2MTC 2015 - Proceedings (pp. 1662-1667). [7151529] (Conference Record - IEEE Instrumentation and Measurement Technology Conference; Vol. 2015-July). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/I2MTC.2015.7151529