Analytical approach for the exact phase noise analysis of oscillators

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The output noise power spectral density of a class of oscillators is calculated analytically and exactly. An example is shown as an illustration. The analytical results derived here agree with measurements and simulations published elsewhere.

Original languageEnglish
Title of host publicationProceedings - IEEE International Symposium on Circuits and Systems
Pages771-774
Number of pages4
Volume3
Publication statusPublished - 2001
EventIEEE International Symposium on Circuits and Systems (ISCAS 2001) - Sydney, NSW, Australia
Duration: May 6 2001May 9 2001

Other

OtherIEEE International Symposium on Circuits and Systems (ISCAS 2001)
CountryAustralia
CitySydney, NSW
Period5/6/015/9/01

Fingerprint

Power spectral density
Phase noise

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Hardware and Architecture

Cite this

Tóth, L. (2001). Analytical approach for the exact phase noise analysis of oscillators. In Proceedings - IEEE International Symposium on Circuits and Systems (Vol. 3, pp. 771-774)

Analytical approach for the exact phase noise analysis of oscillators. / Tóth, L.

Proceedings - IEEE International Symposium on Circuits and Systems. Vol. 3 2001. p. 771-774.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Tóth, L 2001, Analytical approach for the exact phase noise analysis of oscillators. in Proceedings - IEEE International Symposium on Circuits and Systems. vol. 3, pp. 771-774, IEEE International Symposium on Circuits and Systems (ISCAS 2001), Sydney, NSW, Australia, 5/6/01.
Tóth L. Analytical approach for the exact phase noise analysis of oscillators. In Proceedings - IEEE International Symposium on Circuits and Systems. Vol. 3. 2001. p. 771-774
Tóth, L. / Analytical approach for the exact phase noise analysis of oscillators. Proceedings - IEEE International Symposium on Circuits and Systems. Vol. 3 2001. pp. 771-774
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