Analysis of tokamak collector probes by resonance ionization spectroscopy

M. Á Kedves, J. Bakos, I. B. Földes, P. N. Ignácz, G. Kocsis

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Resonance ionization spectroscopy has been applied to analyze tokamak collector probes. The edge plasma of the MT-1 tokamak was investigated using nonintrinsic sodium impurities injected by the laser blow-off technique. Silicon single crystal deposition probes were analyzed by laser atomization, followed by the resonance ionization method. The unique sensitivity of the selective photoionization made it possible to determine the radial distribution of impurities on a probe exposed to a single tokamak discharge.

Original languageEnglish
Pages (from-to)296-298
Number of pages3
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume47
Issue number3
DOIs
Publication statusPublished - 1990

Fingerprint

accumulators
Ionization
Spectroscopy
ionization
probes
Impurities
spectroscopy
impurities
Photoionization
Lasers
atomizing
Atomization
Silicon
radial distribution
lasers
photoionization
Sodium
sodium
Single crystals
Plasmas

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Instrumentation
  • Surfaces and Interfaces

Cite this

Analysis of tokamak collector probes by resonance ionization spectroscopy. / Kedves, M. Á; Bakos, J.; Földes, I. B.; Ignácz, P. N.; Kocsis, G.

In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 47, No. 3, 1990, p. 296-298.

Research output: Contribution to journalArticle

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