Analysis of the broadening of X-ray diffraction line profiles of polycrystalline tungsten

V. A. Trubin, A. Szász

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

A statistical regularization approach is applied to calculate the real X-ray diffraction line profile from the measured convolution. Results are applied for tungsten powder.

Original languageEnglish
Pages (from-to)459-467
Number of pages9
JournalPhysica Status Solidi (A) Applied Research
Volume125
Issue number2
Publication statusPublished - Jun 1991

Fingerprint

Tungsten
Convolution
convolution integrals
Powders
tungsten
X ray diffraction
profiles
diffraction
x rays

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Analysis of the broadening of X-ray diffraction line profiles of polycrystalline tungsten. / Trubin, V. A.; Szász, A.

In: Physica Status Solidi (A) Applied Research, Vol. 125, No. 2, 06.1991, p. 459-467.

Research output: Contribution to journalArticle

@article{58e7719bb7fc4d66901e8f18f5f9ef2b,
title = "Analysis of the broadening of X-ray diffraction line profiles of polycrystalline tungsten",
abstract = "A statistical regularization approach is applied to calculate the real X-ray diffraction line profile from the measured convolution. Results are applied for tungsten powder.",
author = "Trubin, {V. A.} and A. Sz{\'a}sz",
year = "1991",
month = "6",
language = "English",
volume = "125",
pages = "459--467",
journal = "Physica Status Solidi (A) Applied Research",
issn = "0031-8965",
publisher = "Wiley-VCH Verlag",
number = "2",

}

TY - JOUR

T1 - Analysis of the broadening of X-ray diffraction line profiles of polycrystalline tungsten

AU - Trubin, V. A.

AU - Szász, A.

PY - 1991/6

Y1 - 1991/6

N2 - A statistical regularization approach is applied to calculate the real X-ray diffraction line profile from the measured convolution. Results are applied for tungsten powder.

AB - A statistical regularization approach is applied to calculate the real X-ray diffraction line profile from the measured convolution. Results are applied for tungsten powder.

UR - http://www.scopus.com/inward/record.url?scp=0026171273&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0026171273&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0026171273

VL - 125

SP - 459

EP - 467

JO - Physica Status Solidi (A) Applied Research

JF - Physica Status Solidi (A) Applied Research

SN - 0031-8965

IS - 2

ER -