Analysis of asymmetric broadening of X-ray diffraction peak profiles caused by randomly distributed polarized dislocation dipoles and dislocation walls

I. Groma, G. Monnet

Research output: Contribution to journalArticle

31 Citations (Scopus)

Abstract

The problem of asymmetric X-ray diffraction peak broadening caused by dislocations is investigated. The leading term responsible for the asymmetry of the intensity distribution is calculated for randomly distributed polarized dipoles and dipole walls. It is found that the polarization structure of a dislocation ensemble can be determined from the diffraction order dependence of the profile asymmetry.

Original languageEnglish
Pages (from-to)589-593
Number of pages5
JournalJournal of Applied Crystallography
Volume35
Issue number5
DOIs
Publication statusPublished - Oct 2002

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X-Ray Diffraction
Diffraction
asymmetry
Polarization
dipoles
X ray diffraction
profiles
diffraction
x rays
polarization

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Structural Biology

Cite this

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abstract = "The problem of asymmetric X-ray diffraction peak broadening caused by dislocations is investigated. The leading term responsible for the asymmetry of the intensity distribution is calculated for randomly distributed polarized dipoles and dipole walls. It is found that the polarization structure of a dislocation ensemble can be determined from the diffraction order dependence of the profile asymmetry.",
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