We present a new spectrometer at the Advanced Photon Source for inelastic X-ray scattering with an energy resolution of 2.2 meV at an incident energy of 21.6 keV. For monochromatization, a nested structure of one silicon channel cut and one 'artificial' channel cut is used in forward-scattering geometry. The energy analysis is achieved by a two-dimensional focusing silicon analyzer in backscattering geometry. In the first demonstration experiments, elastic scattering from a Plexiglas™ sample and two dispersion curves in a beryllium single crystal were measured. Based on these data sets, the performance of the new spectrometer is discussed. Published by Elsevier Science B.V. All rights reserved.
|Number of pages||4|
|Journal||Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment|
|Issue number||PART II|
|Publication status||Published - Jan 1 2001|
ASJC Scopus subject areas
- Nuclear and High Energy Physics