An inelastic X-ray spectrometer with 2.2 meV energy resolution

H. Sinn, E. E. Alp, A. Alatas, J. Barraza, G. Bortel, E. Burkel, D. Shu, W. Sturhahn, J. P. Sutter, T. S. Toellner, J. Zhao

Research output: Contribution to journalArticle

60 Citations (Scopus)

Abstract

We present a new spectrometer at the Advanced Photon Source for inelastic X-ray scattering with an energy resolution of 2.2 meV at an incident energy of 21.6 keV. For monochromatization, a nested structure of one silicon channel cut and one 'artificial' channel cut is used in forward-scattering geometry. The energy analysis is achieved by a two-dimensional focusing silicon analyzer in backscattering geometry. In the first demonstration experiments, elastic scattering from a Plexiglas sample and two dispersion curves in a beryllium single crystal were measured. Based on these data sets, the performance of the new spectrometer is discussed. Published by Elsevier Science B.V. All rights reserved.

Original languageEnglish
Pages (from-to)1545-1548
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume467-468
Issue numberPART II
DOIs
Publication statusPublished - Jan 1 2001

    Fingerprint

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

Cite this

Sinn, H., Alp, E. E., Alatas, A., Barraza, J., Bortel, G., Burkel, E., Shu, D., Sturhahn, W., Sutter, J. P., Toellner, T. S., & Zhao, J. (2001). An inelastic X-ray spectrometer with 2.2 meV energy resolution. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 467-468(PART II), 1545-1548. https://doi.org/10.1016/S0168-9002(01)00755-0