An experimental method for resolution calibration of electron spectrometers

L. Kövér, J. Tóth, A. Itoh

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

A series of X-ray photoelectron spectroscopic (XPS) measurements for testing the performance and determining the spectrometer function of electron spectrometers is described. The method is based on the determination of the natural line width Rh 3 d5/2 in Rh metal by the help of the Coster-Kronig broadening and Auger intensity ratio evaluated from the Rh 3 d3/2 and M45N45N45 Auger spectra, respectively. Applicability of the method is demonstrated in the case of different electron spectrometers, comparing the data obtained in this way to the results of an alternative procedure based on the analysis of conduction band photoelectron spectra of Rh metal samples.

Original languageEnglish
Pages (from-to)217-223
Number of pages7
JournalActa Physica Hungarica
Volume65
Issue number2-3
DOIs
Publication statusPublished - Jun 1 1989

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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