An evaluation of the accuracy and precision of X-ray microanalysis techniques using BCR-126A glass reference material

Inmaculada Gomez-Morilla, Alíz Simon, Rolf Simon, C. Terry Williams, A. Kiss, Geoffrey W. Grime

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

The precision and accuracy of four different X-ray analytical techniques at the micrometre level, PIXE-RBS, PIXE-PIXE, μ-SRXRF and WDS, have been investigated and compared. A range of different reference materials was considered for this purpose, and the glass BCR 126A was selected for the inter-comparison study, due to its homogeneity, chemical stability and elemental composition. The experimental protocols were tailored to employ the standard, optimal measurement conditions for each technique and material, but still retaining comparable measurement parameters between the different methods. The results show that the different techniques can complement each other without compromising in accuracy, and that they agree with each other to better than 5%.

Original languageEnglish
Pages (from-to)897-902
Number of pages6
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume249
Issue number1-2 SPEC. ISS.
DOIs
Publication statusPublished - Aug 2006

Fingerprint

Microanalysis
microanalysis
Wavelength dispersive spectroscopy
X rays
Glass
evaluation
glass
Chemical stability
retaining
complement
homogeneity
micrometers
x rays
Chemical analysis

Keywords

  • Certified glass reference material
  • PIXE
  • Quantitative analysis
  • Synchrotron radiation XRF
  • WDS
  • X-ray microanalysis

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Instrumentation
  • Surfaces and Interfaces

Cite this

An evaluation of the accuracy and precision of X-ray microanalysis techniques using BCR-126A glass reference material. / Gomez-Morilla, Inmaculada; Simon, Alíz; Simon, Rolf; Williams, C. Terry; Kiss, A.; Grime, Geoffrey W.

In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 249, No. 1-2 SPEC. ISS., 08.2006, p. 897-902.

Research output: Contribution to journalArticle

@article{6b57031585af4b369b729c949e9f937e,
title = "An evaluation of the accuracy and precision of X-ray microanalysis techniques using BCR-126A glass reference material",
abstract = "The precision and accuracy of four different X-ray analytical techniques at the micrometre level, PIXE-RBS, PIXE-PIXE, μ-SRXRF and WDS, have been investigated and compared. A range of different reference materials was considered for this purpose, and the glass BCR 126A was selected for the inter-comparison study, due to its homogeneity, chemical stability and elemental composition. The experimental protocols were tailored to employ the standard, optimal measurement conditions for each technique and material, but still retaining comparable measurement parameters between the different methods. The results show that the different techniques can complement each other without compromising in accuracy, and that they agree with each other to better than 5{\%}.",
keywords = "Certified glass reference material, PIXE, Quantitative analysis, Synchrotron radiation XRF, WDS, X-ray microanalysis",
author = "Inmaculada Gomez-Morilla and Al{\'i}z Simon and Rolf Simon and Williams, {C. Terry} and A. Kiss and Grime, {Geoffrey W.}",
year = "2006",
month = "8",
doi = "10.1016/j.nimb.2006.03.159",
language = "English",
volume = "249",
pages = "897--902",
journal = "Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms",
issn = "0168-583X",
publisher = "Elsevier",
number = "1-2 SPEC. ISS.",

}

TY - JOUR

T1 - An evaluation of the accuracy and precision of X-ray microanalysis techniques using BCR-126A glass reference material

AU - Gomez-Morilla, Inmaculada

AU - Simon, Alíz

AU - Simon, Rolf

AU - Williams, C. Terry

AU - Kiss, A.

AU - Grime, Geoffrey W.

PY - 2006/8

Y1 - 2006/8

N2 - The precision and accuracy of four different X-ray analytical techniques at the micrometre level, PIXE-RBS, PIXE-PIXE, μ-SRXRF and WDS, have been investigated and compared. A range of different reference materials was considered for this purpose, and the glass BCR 126A was selected for the inter-comparison study, due to its homogeneity, chemical stability and elemental composition. The experimental protocols were tailored to employ the standard, optimal measurement conditions for each technique and material, but still retaining comparable measurement parameters between the different methods. The results show that the different techniques can complement each other without compromising in accuracy, and that they agree with each other to better than 5%.

AB - The precision and accuracy of four different X-ray analytical techniques at the micrometre level, PIXE-RBS, PIXE-PIXE, μ-SRXRF and WDS, have been investigated and compared. A range of different reference materials was considered for this purpose, and the glass BCR 126A was selected for the inter-comparison study, due to its homogeneity, chemical stability and elemental composition. The experimental protocols were tailored to employ the standard, optimal measurement conditions for each technique and material, but still retaining comparable measurement parameters between the different methods. The results show that the different techniques can complement each other without compromising in accuracy, and that they agree with each other to better than 5%.

KW - Certified glass reference material

KW - PIXE

KW - Quantitative analysis

KW - Synchrotron radiation XRF

KW - WDS

KW - X-ray microanalysis

UR - http://www.scopus.com/inward/record.url?scp=33745964896&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33745964896&partnerID=8YFLogxK

U2 - 10.1016/j.nimb.2006.03.159

DO - 10.1016/j.nimb.2006.03.159

M3 - Article

VL - 249

SP - 897

EP - 902

JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

SN - 0168-583X

IS - 1-2 SPEC. ISS.

ER -