An evaluation of the accuracy and precision of X-ray microanalysis techniques using BCR-126A glass reference material

Inmaculada Gomez-Morilla, Alíz Simon, Rolf Simon, C. Terry Williams, Árpád Z. Kiss, Geoffrey W. Grime

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

The precision and accuracy of four different X-ray analytical techniques at the micrometre level, PIXE-RBS, PIXE-PIXE, μ-SRXRF and WDS, have been investigated and compared. A range of different reference materials was considered for this purpose, and the glass BCR 126A was selected for the inter-comparison study, due to its homogeneity, chemical stability and elemental composition. The experimental protocols were tailored to employ the standard, optimal measurement conditions for each technique and material, but still retaining comparable measurement parameters between the different methods. The results show that the different techniques can complement each other without compromising in accuracy, and that they agree with each other to better than 5%.

Original languageEnglish
Pages (from-to)897-902
Number of pages6
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume249
Issue number1-2 SPEC. ISS.
DOIs
Publication statusPublished - Aug 1 2006

    Fingerprint

Keywords

  • Certified glass reference material
  • PIXE
  • Quantitative analysis
  • Synchrotron radiation XRF
  • WDS
  • X-ray microanalysis

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

Cite this