An electron diffraction study of the molecular geometry of dimethyl sulphone

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Abstract

The present electron diffraction study of dimethyl sulphone eliminates the discrepancy between the values of the parameter ∠O-S-O obtained by microwave spectroscopy and electron diffraction. The following geometrical parameters (ra values) have been obtained: r(C-H) = 1.114±0.003 Å, r(S-O) = 1.435±0.003 Å, r(S-C) = 1.771±0.004 Å, ∠C-S-C = 102.6±0.9°, ∠O-S-O = 119.7±1.1° and ∠S-C-H = 108.5±0.8°. Comparison of sulphone molecular geometries shows a trend toward longer S-O bonds and smaller O-S-O bond angles as ligand electronegativity decreases. The constancy of the O⋯O interatomic distance indicates the importance of non-bonded interactions.

Original languageEnglish
Pages (from-to)283-292
Number of pages10
JournalJournal of Molecular Structure
Volume20
Issue number2
DOIs
Publication statusPublished - Feb 1974

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ASJC Scopus subject areas

  • Analytical Chemistry
  • Spectroscopy
  • Organic Chemistry
  • Inorganic Chemistry

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