Advances in crystal analyzers for inelastic X-ray scattering

R. Verbeni, M. Kocsis, S. Huotari, M. Krisch, G. Monaco, F. Sette, G. Vanko

Research output: Contribution to journalArticle

33 Citations (Scopus)

Abstract

The realization of spherical crystal analyzers for inelastic X-ray scattering experiments (IXS) is an ongoing project at the ESRF since 1992. We developed reliable techniques to routinely produce silicon spherical analyzers with very high (ΔE=1÷10 meV) and high energy resolution (ΔE=0.2÷1.5 eV), and with very good focal properties and efficiency. In this article we report the state of the art of the analyzer construction and the main improvements made during the last years.

Original languageEnglish
Pages (from-to)2299-2305
Number of pages7
JournalJournal of Physics and Chemistry of Solids
Volume66
Issue number12
DOIs
Publication statusPublished - Dec 1 2005

    Fingerprint

Keywords

  • C X-ray diffraction

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

Cite this