ADC testing in standardized and nonstandardized ways, using a unified framework

Tamás Virosztek, I. Kollár

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Several test methods are available to examine static and dynamic properties of analog-todigital converters (ADCs). The most robust and straightforward ones are codified in international standards released by the IEEE, or by the IEC. These methods have been improved based on ideas proposed in scientific papers published in the field of ADC testing. However, there are algorithms and test techniques that are not yet standardized, but could be very useful to achieve more information concerning the device under test. These are predominantly amendments of the standard methods, elaborated to increase the accuracy, robustness, computation demand, etc. Nevertheless, it is important to be able to test ADCs strictly according to the standards, and it can also be important to use methods that go beyond the standardized ones in some aspects. This paper presents an idea to harmonize standard and nonstandard ADC test methods in a single software tool on widely used platforms.

Original languageEnglish
Title of host publication20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014
PublisherIMEKO-International Measurement Federation Secretariat
Pages231-236
Number of pages6
ISBN (Print)9789299007327
Publication statusPublished - 2014
Event20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014 - Benevento, Italy
Duration: Sep 15 2014Sep 17 2014

Other

Other20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014
CountryItaly
CityBenevento
Period9/15/149/17/14

Fingerprint

Converter
converters
analogs
Analogue
Testing
Dynamic Properties
Software Tools
software development tools
Strictly
dynamic characteristics
Framework
Robustness
platforms
Standards

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Modelling and Simulation
  • Instrumentation

Cite this

Virosztek, T., & Kollár, I. (2014). ADC testing in standardized and nonstandardized ways, using a unified framework. In 20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014 (pp. 231-236). IMEKO-International Measurement Federation Secretariat.

ADC testing in standardized and nonstandardized ways, using a unified framework. / Virosztek, Tamás; Kollár, I.

20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014. IMEKO-International Measurement Federation Secretariat, 2014. p. 231-236.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Virosztek, T & Kollár, I 2014, ADC testing in standardized and nonstandardized ways, using a unified framework. in 20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014. IMEKO-International Measurement Federation Secretariat, pp. 231-236, 20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014, Benevento, Italy, 9/15/14.
Virosztek T, Kollár I. ADC testing in standardized and nonstandardized ways, using a unified framework. In 20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014. IMEKO-International Measurement Federation Secretariat. 2014. p. 231-236
Virosztek, Tamás ; Kollár, I. / ADC testing in standardized and nonstandardized ways, using a unified framework. 20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014. IMEKO-International Measurement Federation Secretariat, 2014. pp. 231-236
@inproceedings{4a919e049d384a6daf9c565286a39d16,
title = "ADC testing in standardized and nonstandardized ways, using a unified framework",
abstract = "Several test methods are available to examine static and dynamic properties of analog-todigital converters (ADCs). The most robust and straightforward ones are codified in international standards released by the IEEE, or by the IEC. These methods have been improved based on ideas proposed in scientific papers published in the field of ADC testing. However, there are algorithms and test techniques that are not yet standardized, but could be very useful to achieve more information concerning the device under test. These are predominantly amendments of the standard methods, elaborated to increase the accuracy, robustness, computation demand, etc. Nevertheless, it is important to be able to test ADCs strictly according to the standards, and it can also be important to use methods that go beyond the standardized ones in some aspects. This paper presents an idea to harmonize standard and nonstandard ADC test methods in a single software tool on widely used platforms.",
author = "Tam{\'a}s Virosztek and I. Koll{\'a}r",
year = "2014",
language = "English",
isbn = "9789299007327",
pages = "231--236",
booktitle = "20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014",
publisher = "IMEKO-International Measurement Federation Secretariat",

}

TY - GEN

T1 - ADC testing in standardized and nonstandardized ways, using a unified framework

AU - Virosztek, Tamás

AU - Kollár, I.

PY - 2014

Y1 - 2014

N2 - Several test methods are available to examine static and dynamic properties of analog-todigital converters (ADCs). The most robust and straightforward ones are codified in international standards released by the IEEE, or by the IEC. These methods have been improved based on ideas proposed in scientific papers published in the field of ADC testing. However, there are algorithms and test techniques that are not yet standardized, but could be very useful to achieve more information concerning the device under test. These are predominantly amendments of the standard methods, elaborated to increase the accuracy, robustness, computation demand, etc. Nevertheless, it is important to be able to test ADCs strictly according to the standards, and it can also be important to use methods that go beyond the standardized ones in some aspects. This paper presents an idea to harmonize standard and nonstandard ADC test methods in a single software tool on widely used platforms.

AB - Several test methods are available to examine static and dynamic properties of analog-todigital converters (ADCs). The most robust and straightforward ones are codified in international standards released by the IEEE, or by the IEC. These methods have been improved based on ideas proposed in scientific papers published in the field of ADC testing. However, there are algorithms and test techniques that are not yet standardized, but could be very useful to achieve more information concerning the device under test. These are predominantly amendments of the standard methods, elaborated to increase the accuracy, robustness, computation demand, etc. Nevertheless, it is important to be able to test ADCs strictly according to the standards, and it can also be important to use methods that go beyond the standardized ones in some aspects. This paper presents an idea to harmonize standard and nonstandard ADC test methods in a single software tool on widely used platforms.

UR - http://www.scopus.com/inward/record.url?scp=84918771010&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84918771010&partnerID=8YFLogxK

M3 - Conference contribution

SN - 9789299007327

SP - 231

EP - 236

BT - 20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014

PB - IMEKO-International Measurement Federation Secretariat

ER -