Acquiring real-time heating of cells in standard cell designs

Andras Timar, Marta Rencz

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

In today's digital electronic integrated circuits device heating is one of the most critical issues. Overheating can cause failures in functionality and device malfunction. In certain circumstances overheating of ICs can cause physical destruction of the device itself. This paper introduces a solution to determine cell and gate heating curves across the standard cell ICs surface. The presented methodology and toolset is tightly integrated into standardized logic simulator engines thus providing digital circuit designers a low-level, cell-resolution temperature distribution map during logic simulations. Actual temperatures of each con- sisting cell of the design can be monitored throughout the whole logic simulation. By being able to monitor temperatures of digital cells during initial simulations, it allows us to detect hot-spots and overheating caused malfunctions far before manufacture. By using the spatial location and temperature magnitude of hot-spots acquired from the presented methodology, place and route (P&R) tools can be driven to change cell placement and routing in order to avoid heating caused failures. Additionally, cooling solutions can be developed using the simulated temperature maps of the ICs surface.

Original languageEnglish
Title of host publicationLATW 2012 - 13th IEEE Latin American Test Workshop
DOIs
Publication statusPublished - Oct 5 2012
Event13th IEEE Latin American Test Workshop, LATW 2012 - Quito, Ecuador
Duration: Apr 10 2012Apr 13 2012

Publication series

NameLATW 2012 - 13th IEEE Latin American Test Workshop

Other

Other13th IEEE Latin American Test Workshop, LATW 2012
CountryEcuador
CityQuito
Period4/10/124/13/12

Keywords

  • hot-spot detection
  • logi-thermal simulation
  • temperature distribution

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality

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  • Cite this

    Timar, A., & Rencz, M. (2012). Acquiring real-time heating of cells in standard cell designs. In LATW 2012 - 13th IEEE Latin American Test Workshop [6261249] (LATW 2012 - 13th IEEE Latin American Test Workshop). https://doi.org/10.1109/LATW.2012.6261249