Aberration-free imaging with an aplanatic curved diffractive element

N. Bokor, Nir Davidson

Research output: Contribution to journalArticle

21 Citations (Scopus)

Abstract

We demonstrate an imaging diffractive optical element (DOE) that is free of coma and other first-order aberrations. The DOE was holographically recorded on a properly curved surface and thereby satisfies the Abbe sine (aplanatic) condition. Experimental results as well as numerical ray-tracing simulations indicate that the off-axis aberrations of the curved DOE are much smaller than those of a fiat DOE. Because the recording of the DOE involves a single step and only readily available spherical and plane waves, it is extremely simple.

Original languageEnglish
Pages (from-to)5825-5829
Number of pages5
JournalApplied Optics
Volume40
Issue number32
Publication statusPublished - Nov 10 2001

Fingerprint

Diffractive optical elements
Aberrations
aberration
Imaging techniques
spherical waves
curved surfaces
coma
ray tracing
plane waves
recording
Ray tracing
simulation

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Aberration-free imaging with an aplanatic curved diffractive element. / Bokor, N.; Davidson, Nir.

In: Applied Optics, Vol. 40, No. 32, 10.11.2001, p. 5825-5829.

Research output: Contribution to journalArticle

Bokor, N. ; Davidson, Nir. / Aberration-free imaging with an aplanatic curved diffractive element. In: Applied Optics. 2001 ; Vol. 40, No. 32. pp. 5825-5829.
@article{66776f1baff04201b186ef368fd16dda,
title = "Aberration-free imaging with an aplanatic curved diffractive element",
abstract = "We demonstrate an imaging diffractive optical element (DOE) that is free of coma and other first-order aberrations. The DOE was holographically recorded on a properly curved surface and thereby satisfies the Abbe sine (aplanatic) condition. Experimental results as well as numerical ray-tracing simulations indicate that the off-axis aberrations of the curved DOE are much smaller than those of a fiat DOE. Because the recording of the DOE involves a single step and only readily available spherical and plane waves, it is extremely simple.",
author = "N. Bokor and Nir Davidson",
year = "2001",
month = "11",
day = "10",
language = "English",
volume = "40",
pages = "5825--5829",
journal = "Applied Optics",
issn = "1559-128X",
publisher = "The Optical Society",
number = "32",

}

TY - JOUR

T1 - Aberration-free imaging with an aplanatic curved diffractive element

AU - Bokor, N.

AU - Davidson, Nir

PY - 2001/11/10

Y1 - 2001/11/10

N2 - We demonstrate an imaging diffractive optical element (DOE) that is free of coma and other first-order aberrations. The DOE was holographically recorded on a properly curved surface and thereby satisfies the Abbe sine (aplanatic) condition. Experimental results as well as numerical ray-tracing simulations indicate that the off-axis aberrations of the curved DOE are much smaller than those of a fiat DOE. Because the recording of the DOE involves a single step and only readily available spherical and plane waves, it is extremely simple.

AB - We demonstrate an imaging diffractive optical element (DOE) that is free of coma and other first-order aberrations. The DOE was holographically recorded on a properly curved surface and thereby satisfies the Abbe sine (aplanatic) condition. Experimental results as well as numerical ray-tracing simulations indicate that the off-axis aberrations of the curved DOE are much smaller than those of a fiat DOE. Because the recording of the DOE involves a single step and only readily available spherical and plane waves, it is extremely simple.

UR - http://www.scopus.com/inward/record.url?scp=0003260990&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0003260990&partnerID=8YFLogxK

M3 - Article

C2 - 18364874

AN - SCOPUS:0003260990

VL - 40

SP - 5825

EP - 5829

JO - Applied Optics

JF - Applied Optics

SN - 1559-128X

IS - 32

ER -