A way for measuring the temperature transients of capacitors

Zoltan Sarkany, M. Rencz

Research output: Contribution to journalArticle

Abstract

With the increasing integration level of electronic circuits management of the generated heat became one of the most important design aspects. Beside the semiconductor components capacitors are also affected by the elevated temperature. In this paper a new thermal characterization method is proposed adopting the thermal transient measurement technique for capacitors utilizing the capacitance itself as temperature dependent parameter. The proposed switched capacitor based circuit generates a signal proportional to the capacitance of the component and hence the temperature. The measurement method is demonstrated on self and transfer resistance measurement setups and also verified using CFD simulations. It is shown that the captured thermal transient curve can even be used to fine tune the inaccurate simulation model parameters achieving a more accurate calibrated 3D simulation model.

Original languageEnglish
Pages (from-to)1381-1389
Number of pages9
JournalAdvances in Science, Technology and Engineering Systems
Volume2
Issue number3
DOIs
Publication statusPublished - Jan 1 2017

Fingerprint

capacitors
Capacitors
capacitance
Capacitance
simulation
charge flow devices
Temperature
temperature
Networks (circuits)
heat
Computational fluid dynamics
curves
Semiconductor materials
electronics
Hot Temperature
Simulation model
Simulation
Measurement method
Semiconductors

Keywords

  • Simulation model calibration
  • Switched capacitor
  • Thermal transient measurement

ASJC Scopus subject areas

  • Engineering (miscellaneous)
  • Physics and Astronomy (miscellaneous)
  • Management of Technology and Innovation

Cite this

A way for measuring the temperature transients of capacitors. / Sarkany, Zoltan; Rencz, M.

In: Advances in Science, Technology and Engineering Systems, Vol. 2, No. 3, 01.01.2017, p. 1381-1389.

Research output: Contribution to journalArticle

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