A transition-edge sensor-based X-ray spectrometer for the study of highly charged ions at the National Institute of Standards and Technology electron beam ion trap

P. Szypryt, G. C. O'Neil, E. Takacs, J. N. Tan, S. W. Buechele, A. S. Naing, D. A. Bennett, W. B. Doriese, M. Durkin, J. W. Fowler, J. D. Gard, G. C. Hilton, K. M. Morgan, C. D. Reintsema, D. R. Schmidt, D. S. Swetz, J. N. Ullom, Yu Ralchenko

Research output: Contribution to journalArticle

Abstract

We report on the design, commissioning, and initial measurements of a Transition-Edge Sensor (TES) X-ray spectrometer for the Electron Beam Ion Trap (EBIT) at the National Institute of Standards and Technology (NIST). Over the past few decades, the NIST EBIT has produced numerous studies of highly charged ions in diverse fields such as atomic physics, plasma spectroscopy, and laboratory astrophysics. The newly commissioned NIST EBIT TES Spectrometer (NETS) improves the measurement capabilities of the EBIT through a combination of high X-ray collection efficiency and resolving power. NETS utilizes 192 individual TES X-ray microcalorimeters (166/192 yield) to improve upon the collection area by a factor of ∼30 over the 4-pixel neutron transmutation doped germanium-based microcalorimeter spectrometer previously used at the NIST EBIT. The NETS microcalorimeters are optimized for the X-ray energies from roughly 500 eV to 8000 eV and achieve an energy resolution of 3.7 eV-5.0 eV over this range, a more modest (<2×) improvement over the previous microcalorimeters. Beyond this energy range, NETS can operate with various trade-offs, the most significant of which are reduced efficiency at lower energies and being limited to a subset of the pixels at higher energies. As an initial demonstration of the capabilities of NETS, we measured transitions in He-like and H-like O, Ne, and Ar as well as Ni-like W. We detail the energy calibration and data analysis techniques used to transform detector counts into X-ray spectra, a process that will be the basis for analyzing future data.

Original languageEnglish
Article number123107
JournalReview of Scientific Instruments
Volume90
Issue number12
DOIs
Publication statusPublished - Dec 1 2019

Fingerprint

X ray spectrometers
Spectrometers
Electron beams
electron beams
spectrometers
sensors
Sensors
Ions
calorimeters
X rays
ions
x rays
Pixels
energy
Atomic physics
pixels
Astrophysics
laboratory astrophysics
Optical resolving power
atomic physics

ASJC Scopus subject areas

  • Instrumentation

Cite this

A transition-edge sensor-based X-ray spectrometer for the study of highly charged ions at the National Institute of Standards and Technology electron beam ion trap. / Szypryt, P.; O'Neil, G. C.; Takacs, E.; Tan, J. N.; Buechele, S. W.; Naing, A. S.; Bennett, D. A.; Doriese, W. B.; Durkin, M.; Fowler, J. W.; Gard, J. D.; Hilton, G. C.; Morgan, K. M.; Reintsema, C. D.; Schmidt, D. R.; Swetz, D. S.; Ullom, J. N.; Ralchenko, Yu.

In: Review of Scientific Instruments, Vol. 90, No. 12, 123107, 01.12.2019.

Research output: Contribution to journalArticle

Szypryt, P, O'Neil, GC, Takacs, E, Tan, JN, Buechele, SW, Naing, AS, Bennett, DA, Doriese, WB, Durkin, M, Fowler, JW, Gard, JD, Hilton, GC, Morgan, KM, Reintsema, CD, Schmidt, DR, Swetz, DS, Ullom, JN & Ralchenko, Y 2019, 'A transition-edge sensor-based X-ray spectrometer for the study of highly charged ions at the National Institute of Standards and Technology electron beam ion trap', Review of Scientific Instruments, vol. 90, no. 12, 123107. https://doi.org/10.1063/1.5116717
Szypryt, P. ; O'Neil, G. C. ; Takacs, E. ; Tan, J. N. ; Buechele, S. W. ; Naing, A. S. ; Bennett, D. A. ; Doriese, W. B. ; Durkin, M. ; Fowler, J. W. ; Gard, J. D. ; Hilton, G. C. ; Morgan, K. M. ; Reintsema, C. D. ; Schmidt, D. R. ; Swetz, D. S. ; Ullom, J. N. ; Ralchenko, Yu. / A transition-edge sensor-based X-ray spectrometer for the study of highly charged ions at the National Institute of Standards and Technology electron beam ion trap. In: Review of Scientific Instruments. 2019 ; Vol. 90, No. 12.
@article{dfc4b0844ab24bb8b6bf1720081e4dea,
title = "A transition-edge sensor-based X-ray spectrometer for the study of highly charged ions at the National Institute of Standards and Technology electron beam ion trap",
abstract = "We report on the design, commissioning, and initial measurements of a Transition-Edge Sensor (TES) X-ray spectrometer for the Electron Beam Ion Trap (EBIT) at the National Institute of Standards and Technology (NIST). Over the past few decades, the NIST EBIT has produced numerous studies of highly charged ions in diverse fields such as atomic physics, plasma spectroscopy, and laboratory astrophysics. The newly commissioned NIST EBIT TES Spectrometer (NETS) improves the measurement capabilities of the EBIT through a combination of high X-ray collection efficiency and resolving power. NETS utilizes 192 individual TES X-ray microcalorimeters (166/192 yield) to improve upon the collection area by a factor of ∼30 over the 4-pixel neutron transmutation doped germanium-based microcalorimeter spectrometer previously used at the NIST EBIT. The NETS microcalorimeters are optimized for the X-ray energies from roughly 500 eV to 8000 eV and achieve an energy resolution of 3.7 eV-5.0 eV over this range, a more modest (<2×) improvement over the previous microcalorimeters. Beyond this energy range, NETS can operate with various trade-offs, the most significant of which are reduced efficiency at lower energies and being limited to a subset of the pixels at higher energies. As an initial demonstration of the capabilities of NETS, we measured transitions in He-like and H-like O, Ne, and Ar as well as Ni-like W. We detail the energy calibration and data analysis techniques used to transform detector counts into X-ray spectra, a process that will be the basis for analyzing future data.",
author = "P. Szypryt and O'Neil, {G. C.} and E. Takacs and Tan, {J. N.} and Buechele, {S. W.} and Naing, {A. S.} and Bennett, {D. A.} and Doriese, {W. B.} and M. Durkin and Fowler, {J. W.} and Gard, {J. D.} and Hilton, {G. C.} and Morgan, {K. M.} and Reintsema, {C. D.} and Schmidt, {D. R.} and Swetz, {D. S.} and Ullom, {J. N.} and Yu Ralchenko",
year = "2019",
month = "12",
day = "1",
doi = "10.1063/1.5116717",
language = "English",
volume = "90",
journal = "Review of Scientific Instruments",
issn = "0034-6748",
publisher = "American Institute of Physics Publising LLC",
number = "12",

}

TY - JOUR

T1 - A transition-edge sensor-based X-ray spectrometer for the study of highly charged ions at the National Institute of Standards and Technology electron beam ion trap

AU - Szypryt, P.

AU - O'Neil, G. C.

AU - Takacs, E.

AU - Tan, J. N.

AU - Buechele, S. W.

AU - Naing, A. S.

AU - Bennett, D. A.

AU - Doriese, W. B.

AU - Durkin, M.

AU - Fowler, J. W.

AU - Gard, J. D.

AU - Hilton, G. C.

AU - Morgan, K. M.

AU - Reintsema, C. D.

AU - Schmidt, D. R.

AU - Swetz, D. S.

AU - Ullom, J. N.

AU - Ralchenko, Yu

PY - 2019/12/1

Y1 - 2019/12/1

N2 - We report on the design, commissioning, and initial measurements of a Transition-Edge Sensor (TES) X-ray spectrometer for the Electron Beam Ion Trap (EBIT) at the National Institute of Standards and Technology (NIST). Over the past few decades, the NIST EBIT has produced numerous studies of highly charged ions in diverse fields such as atomic physics, plasma spectroscopy, and laboratory astrophysics. The newly commissioned NIST EBIT TES Spectrometer (NETS) improves the measurement capabilities of the EBIT through a combination of high X-ray collection efficiency and resolving power. NETS utilizes 192 individual TES X-ray microcalorimeters (166/192 yield) to improve upon the collection area by a factor of ∼30 over the 4-pixel neutron transmutation doped germanium-based microcalorimeter spectrometer previously used at the NIST EBIT. The NETS microcalorimeters are optimized for the X-ray energies from roughly 500 eV to 8000 eV and achieve an energy resolution of 3.7 eV-5.0 eV over this range, a more modest (<2×) improvement over the previous microcalorimeters. Beyond this energy range, NETS can operate with various trade-offs, the most significant of which are reduced efficiency at lower energies and being limited to a subset of the pixels at higher energies. As an initial demonstration of the capabilities of NETS, we measured transitions in He-like and H-like O, Ne, and Ar as well as Ni-like W. We detail the energy calibration and data analysis techniques used to transform detector counts into X-ray spectra, a process that will be the basis for analyzing future data.

AB - We report on the design, commissioning, and initial measurements of a Transition-Edge Sensor (TES) X-ray spectrometer for the Electron Beam Ion Trap (EBIT) at the National Institute of Standards and Technology (NIST). Over the past few decades, the NIST EBIT has produced numerous studies of highly charged ions in diverse fields such as atomic physics, plasma spectroscopy, and laboratory astrophysics. The newly commissioned NIST EBIT TES Spectrometer (NETS) improves the measurement capabilities of the EBIT through a combination of high X-ray collection efficiency and resolving power. NETS utilizes 192 individual TES X-ray microcalorimeters (166/192 yield) to improve upon the collection area by a factor of ∼30 over the 4-pixel neutron transmutation doped germanium-based microcalorimeter spectrometer previously used at the NIST EBIT. The NETS microcalorimeters are optimized for the X-ray energies from roughly 500 eV to 8000 eV and achieve an energy resolution of 3.7 eV-5.0 eV over this range, a more modest (<2×) improvement over the previous microcalorimeters. Beyond this energy range, NETS can operate with various trade-offs, the most significant of which are reduced efficiency at lower energies and being limited to a subset of the pixels at higher energies. As an initial demonstration of the capabilities of NETS, we measured transitions in He-like and H-like O, Ne, and Ar as well as Ni-like W. We detail the energy calibration and data analysis techniques used to transform detector counts into X-ray spectra, a process that will be the basis for analyzing future data.

UR - http://www.scopus.com/inward/record.url?scp=85076713478&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85076713478&partnerID=8YFLogxK

U2 - 10.1063/1.5116717

DO - 10.1063/1.5116717

M3 - Article

C2 - 31893849

AN - SCOPUS:85076713478

VL - 90

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 12

M1 - 123107

ER -