A simple linear technique for measuring the carrier-envelope offset phase of ultrashort pulses

P. Jójárt, Á Börzsönyi, S. Koke, M. Görbe, K. Osvay

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A spectrally resolved multiple beam interferometer is capable for measuring the carrier-envelope offset phase of ultrashort laser pulses with an accuracy of 70mrad. The performance has been cross-calibrated with a conventional f-to-2f interferometer.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationScience and Innovations, CLEO_SI 2011
Publication statusPublished - Dec 1 2011
EventCLEO: Science and Innovations, CLEO_SI 2011 - Baltimore, MD, United States
Duration: May 1 2011May 6 2011

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherCLEO: Science and Innovations, CLEO_SI 2011
CountryUnited States
CityBaltimore, MD
Period5/1/115/6/11

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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    Jójárt, P., Börzsönyi, Á., Koke, S., Görbe, M., & Osvay, K. (2011). A simple linear technique for measuring the carrier-envelope offset phase of ultrashort pulses. In CLEO: Science and Innovations, CLEO_SI 2011 (Optics InfoBase Conference Papers).