A simple linear technique for measuring the carrier-envelope offset phase of ultrashort pulses

P. Jójárt, Á Börzsönyi, S. Koke, M. Görbe, K. Osvay

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A spectrally resolved multiple beam interferometer is capable for measuring the carrier-envelope offset phase of ultrashort laser pulses with an accuracy of 70mrad. The performance has been cross-calibrated with a conventional f-to-2f interferometer.

Original languageEnglish
Title of host publication2011 Conference on Lasers and Electro-Optics
Subtitle of host publicationLaser Science to Photonic Applications, CLEO 2011
PublisherIEEE Computer Society
ISBN (Print)9781557529107
DOIs
Publication statusPublished - 2011

Publication series

Name2011 Conference on Lasers and Electro-Optics: Laser Science to Photonic Applications, CLEO 2011

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics

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    Jójárt, P., Börzsönyi, Á., Koke, S., Görbe, M., & Osvay, K. (2011). A simple linear technique for measuring the carrier-envelope offset phase of ultrashort pulses. In 2011 Conference on Lasers and Electro-Optics: Laser Science to Photonic Applications, CLEO 2011 [5950755] (2011 Conference on Lasers and Electro-Optics: Laser Science to Photonic Applications, CLEO 2011). IEEE Computer Society. https://doi.org/10.1364/cleo_si.2011.cwi6