A second-order phase-transformation of the dislocation structure during plastic deformation determined by in situ synchrotron X-ray diffraction

E. Schafler, K. Simon, S. Bernstorff, P. Hanák, G. Tichy, T. Ungár, M. J. Zehetbauer

Research output: Contribution to journalArticle

54 Citations (Scopus)

Abstract

In situ X-ray diffraction peak profile analysis during plastic deformation in [001] oriented copper single crystals was carried out using synchrotron radiation. Characteristic changes of the hardening coefficient indicate that a transition occurs from stage III to stage IV which has been observed for the first time in a single crystal under low temperature deformation conditions. The long-range internal stresses, the dislocation arrangement parameters and the fluctuations of the dislocation density show non-monotonous changes at this transition suggesting that the dislocation structure, especially within the cell-wall regions, reveals a second-order phase transition. A microscopic dislocation model is introduced which not only illustrates the break of symmetry, but also describes well the development of new grains ("fragmentation") during plastic deformation.

Original languageEnglish
Pages (from-to)315-322
Number of pages8
JournalActa Materialia
Volume53
Issue number2
DOIs
Publication statusPublished - Jan 10 2005

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Polymers and Plastics
  • Metals and Alloys

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