A scanning electron microscopy survey of pollen grains of sour cherry cultivars

J. Nyéki, Z. Szabó, E. FelhosnéVáczi, F. Csillag, P. Sótonyi

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Pollen grains of four sour cherry cultivars were examined in 1990 and 1992 using scanning electron microscopy. Two varieties were tested also by analytical electron microscopy. Examination of the morphological characteristics of the pollen surface revealed the surface structure of varieties to be different. Ridge characteristics and number and size of pits can be used to distinguish between cultivars.

Original languageEnglish
Pages (from-to)133-135
Number of pages3
JournalActa Horticulturae
Volume410
DOIs
Publication statusPublished - Nov 1 1996

ASJC Scopus subject areas

  • Horticulture

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