A new SR-TXRF vacuum chamber for ultra-trace analysis at HASYLAB, Beamline L

C. Streli, G. Pepponi, P. Wobrauschek, C. Jokubonis, G. Falkenberg, G. Záray

Research output: Contribution to journalArticle

19 Citations (Scopus)

Abstract

A new vacuum chamber for synchrotron radiation-induced total reflection x-ray fluorescence (SR-TXRF) analysis has been installed at HASYLAB, DESY, Hamburg, beamline L utilizing the translation and rotation stages of the regular microfocus setup for adjustment. The chamber is equipped with an automatic sample loader for 30 mm diameter quartz reflectors for inserting the prepared sample reflectors in the measuring position with high reproducibility. Alternatively, a chuck can be inserted allowing various sizes and shapes of samples to be measured. The fluorescence radiation emitted by the sample was measured by a silicon drift detector (SDD) with a 5 mm2 active area and detection limits of 15 fg have been obtained on a sample containing 100 pg of Ni using an Ni/C multilayer monochromator. Using the Si 111 crystal monochromator also x-ray absorption near edge structure (XANES) investigations in total reflection geometry on trace elements are feasible. Cr K-edge XANES measurements of C. avellana L. (hazel) pollen (20 ppm Cr concentration) and on an urban aerosol sample are presented. The Cr content in the pollen amounts to about 20 ppm, Detection limits of Cr were found to be 40 pg for a 30 s measuring time, which seems to be reasonable for performing energy scans for x-ray absorption fine structure measurements. Further, the setup is suitable to perform angle scans to determine depth profiles of implants in Si wafers. This was tested for ultra-shallow implants of As in Si.

Original languageEnglish
Pages (from-to)451-455
Number of pages5
JournalX-Ray Spectrometry
Volume34
Issue number5
DOIs
Publication statusPublished - Sep 2005

Fingerprint

Trace analysis
Synchrotron radiation
Fluorescence
Vacuum
X rays
Monochromators
Chucks
Loaders
Quartz
Trace Elements
Silicon
Aerosols
Multilayers
Detectors
Radiation
Crystals
Geometry

ASJC Scopus subject areas

  • Spectroscopy

Cite this

Streli, C., Pepponi, G., Wobrauschek, P., Jokubonis, C., Falkenberg, G., & Záray, G. (2005). A new SR-TXRF vacuum chamber for ultra-trace analysis at HASYLAB, Beamline L. X-Ray Spectrometry, 34(5), 451-455. https://doi.org/10.1002/xrs.861

A new SR-TXRF vacuum chamber for ultra-trace analysis at HASYLAB, Beamline L. / Streli, C.; Pepponi, G.; Wobrauschek, P.; Jokubonis, C.; Falkenberg, G.; Záray, G.

In: X-Ray Spectrometry, Vol. 34, No. 5, 09.2005, p. 451-455.

Research output: Contribution to journalArticle

Streli, C, Pepponi, G, Wobrauschek, P, Jokubonis, C, Falkenberg, G & Záray, G 2005, 'A new SR-TXRF vacuum chamber for ultra-trace analysis at HASYLAB, Beamline L', X-Ray Spectrometry, vol. 34, no. 5, pp. 451-455. https://doi.org/10.1002/xrs.861
Streli C, Pepponi G, Wobrauschek P, Jokubonis C, Falkenberg G, Záray G. A new SR-TXRF vacuum chamber for ultra-trace analysis at HASYLAB, Beamline L. X-Ray Spectrometry. 2005 Sep;34(5):451-455. https://doi.org/10.1002/xrs.861
Streli, C. ; Pepponi, G. ; Wobrauschek, P. ; Jokubonis, C. ; Falkenberg, G. ; Záray, G. / A new SR-TXRF vacuum chamber for ultra-trace analysis at HASYLAB, Beamline L. In: X-Ray Spectrometry. 2005 ; Vol. 34, No. 5. pp. 451-455.
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