A new method to measure fast defect transients in semiconductor and/or insulator samples

Research output: Contribution to journalArticle

6 Citations (Scopus)
Original languageEnglish
Pages (from-to)228-230
Number of pages3
JournalSolid State Electronics
Volume35
Issue number2
DOIs
Publication statusPublished - Feb 1992

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

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