A method for complete characterization of the macroscopic geometry of grain boundaries

A. K. Kiss, J. Lábár

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

In the current paper a new method is presented that determines the five macroscopic parameters of a grain boundary (GB) from electron diffraction patterns and bright field (BF) images in a transmission electron microscope. Usefulness of the method is demonstrated on a set of GBs measured in laser crystallized Si thin films. To characterize the geometry of a grain boundary, we have to determine the misorientation between the neighboring grains, and the direction of the GB-plane. The misorientation is calculated from two convergent beam electron diffraction (CBED) patterns taken on the neighboring grains, and the plane-normal can be calculated from bright field (BF) images of the GB. The thickness of the sample is also needed and it is measured from a CBED pattern taken in two-beam condition. It has been previously observed in metallic thin films, that the GBs can minimize their energy in two alternative ways in thin films: either forming a GB plane with low energy density or minimizing the area of the plane. In the last case the GB plane is almost normal to the surface of the specimen and has a general index. We found, that boundaries with exact Σ3 misorientation generally adopted low energy-density {111} boundary planes and formed coherent twins. The rest of the boundaries adopted general index planes and minimized the surface area of the boundary. The last group included boundaries with small deviation from Σ3 misorientation, other special highangle boundaries with Σ-value>3 and boundaries with general misorientation.

Original languageEnglish
Title of host publicationMaterials Science Forum
Pages97-102
Number of pages6
Volume729
DOIs
Publication statusPublished - 2013
Event8th Hungarian Conference on Materials Science - Balatonkenese, Hungary
Duration: Oct 9 2011Oct 11 2011

Publication series

NameMaterials Science Forum
Volume729
ISSN (Print)02555476

Other

Other8th Hungarian Conference on Materials Science
CountryHungary
CityBalatonkenese
Period10/9/1110/11/11

Fingerprint

Grain boundaries
grain boundaries
misalignment
Geometry
geometry
Electron diffraction
Diffraction patterns
diffraction patterns
electron diffraction
Thin films
thin films
flux density
Metallic films
Electron microscopes
electron microscopes
Lasers
deviation
lasers
energy

Keywords

  • Grain boundary (GB)
  • Grain boundary plane
  • Si
  • TEM

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanical Engineering
  • Mechanics of Materials

Cite this

Kiss, A. K., & Lábár, J. (2013). A method for complete characterization of the macroscopic geometry of grain boundaries. In Materials Science Forum (Vol. 729, pp. 97-102). (Materials Science Forum; Vol. 729). https://doi.org/10.4028/www.scientific.net/MSF.729.97

A method for complete characterization of the macroscopic geometry of grain boundaries. / Kiss, A. K.; Lábár, J.

Materials Science Forum. Vol. 729 2013. p. 97-102 (Materials Science Forum; Vol. 729).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kiss, AK & Lábár, J 2013, A method for complete characterization of the macroscopic geometry of grain boundaries. in Materials Science Forum. vol. 729, Materials Science Forum, vol. 729, pp. 97-102, 8th Hungarian Conference on Materials Science, Balatonkenese, Hungary, 10/9/11. https://doi.org/10.4028/www.scientific.net/MSF.729.97
Kiss, A. K. ; Lábár, J. / A method for complete characterization of the macroscopic geometry of grain boundaries. Materials Science Forum. Vol. 729 2013. pp. 97-102 (Materials Science Forum).
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