A linear optical method for measuring the carrier envelope offset phase

Karoly Osvay, Mihaly Görbe, Christian Grebing, Günter Steinmeyer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A linear optical method is demonstrated for extracting the carrier-envelope offset phase via the fringe visibility in a combined two-path multi-path interferometer. This method is applicable to a wider class of lasers than g-to-2g interferometry.

Original languageEnglish
Title of host publication2008 Conference on Quantum Electronics and Laser Science Conference on Lasers and Electro-Optics, CLEO/QELS
DOIs
Publication statusPublished - Sep 15 2008
EventConference on Quantum Electronics and Laser Science Conference on Lasers and Electro-Optics, CLEO/QELS 2008 - San Jose, CA, United States
Duration: May 4 2008May 9 2008

Publication series

Name2008 Conference on Quantum Electronics and Laser Science Conference on Lasers and Electro-Optics, CLEO/QELS

Other

OtherConference on Quantum Electronics and Laser Science Conference on Lasers and Electro-Optics, CLEO/QELS 2008
CountryUnited States
CitySan Jose, CA
Period5/4/085/9/08

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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  • Cite this

    Osvay, K., Görbe, M., Grebing, C., & Steinmeyer, G. (2008). A linear optical method for measuring the carrier envelope offset phase. In 2008 Conference on Quantum Electronics and Laser Science Conference on Lasers and Electro-Optics, CLEO/QELS [4551535] (2008 Conference on Quantum Electronics and Laser Science Conference on Lasers and Electro-Optics, CLEO/QELS). https://doi.org/10.1109/CLEO.2008.4551535