μ-SR investigations in silicon

T. N. Mamedov, K. I. Gritsaj, A. V. Stoykov, D. G. Andrianov, V. N. Gorelkin, D. Herlach, U. Zimmermann, O. Kormann, J. Major, M. Schefzik

Research output: Contribution to journalConference article

11 Citations (Scopus)

Abstract

Results on the temperature dependence of the residual polarization of negative muons in silicon with phosphorus (4.5×1018, 2.3×1015, and 3.2×1012 cm-3) and aluminum (2.4×1018 and 2×1014 cm-3) impurities are presented. The muon spin rotation (μSR) experiments were carried out in a magnetic field of 0.2 T and in the temperature range 4.2-300 K. In all investigated samples a relaxation of the muon spin and a shift of the spin-precession frequency were observed. The frequency shift (relative to the room-temperature value) amounts to 7×10-3 at 15 K. In the sample with a high concentration of phosphorus impurity (4.5×1018 cm-3) damped and undamped components of the muon spin polarization were observed at T<30 K. Hyperfine interaction between the magnetic moments of the muon and that of the electron shell of the muonic atom (acceptor centre-μAl) is estimated on the basis of the muon spin precession frequency shift data. The temperature dependence of the spin-lattice relaxation rate of the magnetic moment of the shallow acceptor centre in silicon in the absence of external stress is determined for the first time. It is found that the relaxation rate is well approximated by the power function v(T) = CTq, where the parameter q lies between 2 and 3.

Original languageEnglish
Pages (from-to)574-577
Number of pages4
JournalPhysica B: Condensed Matter
Volume289-290
DOIs
Publication statusPublished - Aug 2000
Event8th International Conference on Muon Spin Rotation, Relaxation and Resonance (muSR'99) - Les Diablerets, Switz
Duration: Aug 30 1999Sep 3 1999

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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    Mamedov, T. N., Gritsaj, K. I., Stoykov, A. V., Andrianov, D. G., Gorelkin, V. N., Herlach, D., Zimmermann, U., Kormann, O., Major, J., & Schefzik, M. (2000). μ-SR investigations in silicon. Physica B: Condensed Matter, 289-290, 574-577. https://doi.org/10.1016/S0921-4526(00)00261-1