• 1695 Citations
  • 20 h-Index
1975 …2019
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Fingerprint Dive into the research topics where T. Lohner is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 22 Similar Profiles
ellipsometry Physics & Astronomy
Spectroscopic ellipsometry Engineering & Materials Science
Silicon Chemical Compounds
Ion implantation Engineering & Materials Science
Rutherford backscattering spectroscopy Engineering & Materials Science
Ions Engineering & Materials Science
backscattering Physics & Astronomy
Ellipsometry Engineering & Materials Science

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Research Output 1975 2019

  • 1695 Citations
  • 20 h-Index
  • 160 Article
  • 22 Conference contribution
  • 2 Chapter

Optical Properties of Oxidized, Hydrogenated, and Native Zirconium Surfaces for Wavelengths from 0.3 to 25 µm − A Study by Ex Situ and In Situ Spectroscopic Ellipsometry

Petrik, P., Romanenko, A., Kalas, B., Péter, L., Novotny, T., Perez-Feró, E., Fodor, B., Agocs, E., Lohner, T., Kurunczi, S., Stoica, M., Gartner, M. & Hózer, Z., Jan 1 2019, In : Physica Status Solidi (A) Applications and Materials Science. 1800676.

Research output: Contribution to journalArticle

Spectroscopic ellipsometry
Zirconium
Ellipsometry
ellipsometry
Optical properties

Refractive index variation of magnetron-sputtered a-Si1-xGex by "one-sample concept" combinatory

Lohner, T., Kalas, B., Petrik, P., Zolnai, Z., Serényi, M. & Sáfrán, G., May 21 2018, In : Applied Sciences (Switzerland). 8, 5, 826.

Research output: Contribution to journalArticle

Refractive index
Optical constants
Ellipsometry
refractivity
ellipsometry
4 Citations (Scopus)

Comparison in formation, optical properties and applicability of DC magnetron and RF sputtered aluminum oxide films

Serényi, M., Lohner, T., Sáfrán, G. & Szívós, J., Jun 1 2016, In : Vacuum. 128, p. 213-218 6 p.

Research output: Contribution to journalArticle

Aluminum Oxide
Oxide films
oxide films
radio frequencies
Alumina