• 1355 Citations
  • 20 h-Index
19962020

Research output per year

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Research Output

2020
Open Access

Determination of the complex dielectric function of ion-implanted amorphous germanium by spectroscopic ellipsometry

Lohner, T., Szilágyi, E., Zolnai, Z., Németh, A., Fogarassy, Z., Illés, L., Kótai, E., Petrik, P. & Fried, M., May 1 2020, In : Coatings. 10, 5, 480.

Research output: Contribution to journalArticle

Open Access

Dextran-based hydrogel layers for biosensors

Saftics, A., Türk, B., Sulyok, A., Nagy, N., Agócs, E., Kalas, B., Petrik, P., Fried, M., Khánh, N. Q., Prósz, A., Kamarás, K., Szekacs, I., Horvath, R. & Kurunczi, S., Jan 1 2020, Nanobiomaterial Engineering: Concepts and Their Applications in Biomedicine and Diagnostics. Springer Singapore, p. 139-164 26 p.

Research output: Chapter in Book/Report/Conference proceedingChapter

High-quality PMMA/ZnO NWs piezoelectric coating on rigid and flexible metallic substrates

Chelu, M., Stroescu, H., Anastasescu, M., Calderon-Moreno, J. M., Preda, S., Stoica, M., Fogarassy, Z., Petrik, P., Gheorghe, M., Parvulescu, C., Brasoveanu, C., Dinescu, A., Moldovan, C. & Gartner, M., Nov 1 2020, In : Applied Surface Science. 529, 147135.

Research output: Contribution to journalArticle

Optimization of co-sputtered CrxAl1−xN thin films for piezoelectric MEMS devices

Soleimani, S., Kalas, B., Horváth, Z. E., Zolnai, Z., Czigány, Z., Németh, A., Petrik, P. & Volk, J., Jun 1 2020, In : Journal of Materials Science: Materials in Electronics. 31, 11, p. 8136-8143 8 p.

Research output: Contribution to journalArticle

1 Citation (Scopus)
2019

Changes in composite nc-Si-SiO2 thin films caused by 20 MeV electron irradiation

Nesheva, D., Petrik, P., Hristova-Vasileva, T., Fogarassy, Z., Kalas, B., Šćepanović, M., Kaschieva, S., Dmitriev, S. N. & Antonova, K., Jan 1 2019, In : Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms.

Research output: Contribution to journalArticle

1 Citation (Scopus)

Optical Properties of Oxidized, Hydrogenated, and Native Zirconium Surfaces for Wavelengths from 0.3 to 25 µm − A Study by Ex Situ and In Situ Spectroscopic Ellipsometry

Petrik, P., Romanenko, A., Kalas, B., Péter, L., Novotny, T., Perez-Feró, E., Fodor, B., Agocs, E., Lohner, T., Kurunczi, S., Stoica, M., Gartner, M. & Hózer, Z., Jan 1 2019, In : Physica Status Solidi (A) Applications and Materials Science. 1800676.

Research output: Contribution to journalArticle

Pulsed laser deposition of aluminum nitride films: Correlation between mechanical, optical, and structural properties

Kolaklieva, L., Chitanov, V., Szekeres, A., Antonova, K., Terziyska, P., Fogarassy, Z., Petrik, P., Mihailescu, I. N. & Duta, L., 2019, In : Coatings. 9, 3, 195.

Research output: Contribution to journalArticle

Open Access
3 Citations (Scopus)

Swift heavy ion irradiated planar waveguides in a rare earth doped tungsten Tellurite glass and a tungstate crystal

Bányász, I., Nagy, G. U. L., Rajta, I., Havránek, V., Vosecek, V., Fried, M., Petrik, P., Agócs, E., Kalas, B., Veres, M. & Holomb, R., Dec 10 2019, Proceedings of the International Conference of Computational Methods in Sciences and Engineering 2019, ICCMSE 2019. Simos, T. E., Simos, T. E., Simos, T. E., Kalogiratou, Z. & Monovasilis, T. (eds.). American Institute of Physics Inc., 040002. (AIP Conference Proceedings; vol. 2186).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2018

Electrochemical Sensors for Detection of Different Ionic Species (Nitrites/Nitrates and Heavy Metals) in Natural Water Sources

Gartner, M., Lete, C., Chelu, M., Stroescu, H., Zaharescu, M., Moldovan, C., Brasoveanu, C., Gheorghe, M., Gheorghe, S., Duta, A., Labadi, Z., Kalas, B., Saftics, A., Fried, M., Petrik, P., Toth, E., Jankovics, H. & Vonderviszt, F., Nov 16 2018, 2018 41st International Semiconductor Conference, CAS 2018 - Proceedings. Dinescu, M. A., Dobrescu, D., Muller, A., Cristea, D., Dragoman, M., Muller, R., Ciurea, M. L., Neculoiu, D. & Brezeanu, G. (eds.). Institute of Electrical and Electronics Engineers Inc., Vol. 2018-October. p. 329-332 4 p. 8539739

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Influence of 20 MeV electron irradiation on the optical properties and phase composition of SiOx thin films

Hristova-Vasileva, T., Petrik, P., Nesheva, D., Fogarassy, Z., Lábár, J., Kaschieva, S., Dmitriev, S. N. & Antonova, K., May 21 2018, In : Journal of Applied Physics. 123, 19, 195303.

Research output: Contribution to journalArticle

2 Citations (Scopus)

Refractive index variation of magnetron-sputtered a-Si1-xGex by "one-sample concept" combinatory

Lohner, T., Kalas, B., Petrik, P., Zolnai, Z., Serényi, M. & Sáfrán, G., May 21 2018, In : Applied Sciences (Switzerland). 8, 5, 826.

Research output: Contribution to journalArticle

2 Citations (Scopus)

Solar cells with photonic and plasmonic structures

Petrik, P., Jan 1 2018, Springer Series in Optical Sciences. Springer Verlag, p. 509-522 14 p. (Springer Series in Optical Sciences; vol. 212).

Research output: Chapter in Book/Report/Conference proceedingChapter

2017

Design, Ion beam fabrication and test of integrated optical elements

Bányász, I., Pelli, S., Nunzi-Conti, G., Righini, G. C., Berneschi, S., Szilágyi, E., Németh, A., Fried, M., Petrik, P., Agócs, E., Kalas, B., Zolnai, Z., Khanh, N. Q., Rajta, I., Nagy, G. U. L., Havranek, V., Vosecek, V., Veres, M. & Himics, L., 2017, PHOTOPTICS 2018 - Proceedings of the 6th International Conference on Photonics, Optics and Laser Technology. Raposo, M. & Ribeiro, P. A. (eds.). SciTePress, p. 279-285 7 p. (PHOTOPTICS 2018 - Proceedings of the 6th International Conference on Photonics, Optics and Laser Technology; vol. 2017-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Open Access

Ellipsometric and X-Ray Spectrometric Investigation of Fibrinogen Protein Layers

Kalas, B., Pollakowski, B., Nutsch, A., Streeck, C., Nador, J., Fried, M., Beckhoff, B. & Petrik, P., Dec 1 2017, In : Physica Status Solidi (C) Current Topics in Solid State Physics. 14, 12, 1700210.

Research output: Contribution to journalArticle

1 Citation (Scopus)

Nanophotonics of biomaterials and inorganic nanostructures

Petrik, P., Agocs, E., Kalas, B., Fodor, B., Lohner, T., Nador, J., Saftics, A., Kurunczi, S., Novotny, T., Perez-Feró, E., Nagy, R., Hamori, A., Horvath, R., Hózer, Z. & Fried, M., Feb 22 2017, In : Journal of Physics: Conference Series. 794, 1, 012004.

Research output: Contribution to journalConference article

Optical and structural characterization of Ge clusters embedded in ZrO 2

Agocs, E., Zolnai, Z., Rossall, A. K., van den Berg, J. A., Fodor, B., Lehninger, D., Khomenkova, L., Ponomaryov, S., Gudymenko, O., Yukhymchuk, V., Kalas, B., Heitmann, J. & Petrik, P., Nov 1 2017, In : Applied Surface Science. 421, p. 283-288 6 p.

Research output: Contribution to journalArticle

2 Citations (Scopus)

Protein adsorption monitored by plasmon-enhanced semi-cylindrical Kretschmann ellipsometry

Kalas, B., Nador, J., Agocs, E., Saftics, A., Kurunczi, S., Fried, M. & Petrik, P., Nov 1 2017, In : Applied Surface Science. 421, p. 585-592 8 p.

Research output: Contribution to journalArticle

6 Citations (Scopus)

Spectroellipsometric detection of silicon substrate damage caused by radiofrequency sputtering of niobium oxide

Lohner, T., Serényi, M., Szilágyi, E., Zolnai, Z., Czigány, Z., Khánh, N. Q., Petrik, P. & Fried, M., Nov 1 2017, In : Applied Surface Science. 421, p. 636-642 7 p.

Research output: Contribution to journalArticle

Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires

Fodor, B., Defforge, T., Agócs, E., Fried, M., Gautier, G. & Petrik, P., Nov 1 2017, In : Applied Surface Science. 421, p. 397-404 8 p.

Research output: Contribution to journalArticle

9 Citations (Scopus)

TEM and AFM studies of aluminium nitride films synthesized by pulsed laser deposition

Fogarassy, Z., Petrik, P., Duta, L., Mihailescu, I. N., Anastasescu, M., Gartner, M., Antonova, K. & Szekeres, A., Dec 1 2017, In : Applied Physics A: Materials Science and Processing. 123, 12, 756.

Research output: Contribution to journalArticle

1 Citation (Scopus)
2016

Effective medium approximation of ellipsometric response from random surface roughness simulated by finite-element method

Fodor, B., Kozma, P., Burger, S., Fried, M. & Petrik, P., Oct 30 2016, In : Thin Solid Films. 617, p. 20-24 5 p.

Research output: Contribution to journalArticle

9 Citations (Scopus)

Grating coupled optical waveguide interferometry combined with in situ spectroscopic ellipsometry to monitor surface processes in aqueous solutions

Agocs, E., Kozma, P., Nador, J., Hamori, A., Janosov, M., Kalas, B., Kurunczi, S., Fodor, B., Ehrentreich-Förster, E., Fried, M., Horváth, R. & Petrik, P., Jun 15 2016, (Accepted/In press) In : Applied Surface Science.

Research output: Contribution to journalArticle

3 Citations (Scopus)

Optical properties of Zr and ZrO2

Petrik, P., Sulyok, A., Novotny, T., Perez-Feró, E., Kalas, B., Agocs, E., Lohner, T., Lehninger, D., Khomenkova, L., Nagy, R., Heitmann, J., Menyhard, M. & Hózer, Z., Jul 31 2016, (Accepted/In press) In : Applied Surface Science.

Research output: Contribution to journalArticle

5 Citations (Scopus)

Plasmon-enhanced two-channel in situ Kretschmann ellipsometry of protein adsorption, cellular adhesion, and polyelectrolyte deposition on titania nanostructures

Nador, J., Kalas, B., Saftics, A., Agocs, E., Kozma, P., Korosi, L., Szekacs, I., Fried, M., Horvath, R. & Petrik, P., Mar 7 2016, In : Optics Express. 24, 5, p. 4812-4823 12 p.

Research output: Contribution to journalArticle

10 Citations (Scopus)

Porosity and thickness characterization of porous Si and oxidized porous Si layers - An ultraviolet-visible-mid infrared ellipsometry study

Fodor, B., Agocs, E., Bardet, B., Defforge, T., Cayrel, F., Alquier, D., Fried, M., Gautier, G. & Petrik, P., Jun 2016, In : Microporous and Mesoporous Materials. 227, p. 112-120 9 p.

Research output: Contribution to journalArticle

13 Citations (Scopus)

Ultrafast laser plasma assisted rare-earth doping for silicon photonics

Jose, G., Chandrappan, J., Kamil, S. A., Murray, M., Zolnai, Z., Agocs, E., Petrik, P., Steenson, P. & Krauss, T., Dec 16 2016, 2016 Conference on Lasers and Electro-Optics, CLEO 2016. Institute of Electrical and Electronics Engineers Inc., 7787390. (2016 Conference on Lasers and Electro-Optics, CLEO 2016).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2015

Doping silica beyond limits with laser plasma for active photonic materials

Chandrappan, J., Murray, M., Petrik, P., Agocs, E., Zolnai, Z., Tempez, A., Legendre, S., Steenson, D. P., Jha, A. & Jose, G., 2015, In : Optical Materials Express. 5, 12, p. 2849-2861 13 p.

Research output: Contribution to journalArticle

11 Citations (Scopus)

Expanded beam spectro-ellipsometry for big area on-line monitoring

Fried, M., Major, C., Juhasz, G., Petrik, P. & Horvath, Z., 2015, Proceedings of SPIE - The International Society for Optical Engineering. SPIE, Vol. 9525. 95251S

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fourier ellipsometry - An ellipsometric approach to Fourier scatterometry

Petrik, P., Kumar, N., Fried, M., Fodor, B., Juhasz, G., Pereira, S. F., Burger, S. & Urbach, H. P., Jan 29 2015, In : Journal of the European Optical Society. 10, 15002.

Research output: Contribution to journalArticle

6 Citations (Scopus)

Methods for optical modeling and cross-checking in ellipsometry and scatterometry

Petrik, P., Fodor, B., Agocs, E., Kozma, P., Nador, J., Kumar, N., Endres, J., Juhasz, G., Major, C., Pereira, S. F., Lohner, T., Urbach, H. P., Bodermann, B. & Fried, M., Jan 1 2015, Modeling Aspects in Optical Metrology V. Silver, R. M., Bodermann, B. & Frenner, K. (eds.). SPIE, 95260S. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 9526).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Multiple angle of incidence, spectroscopic, plasmon-enhanced, internal reflection ellipsometry for the characterization of solid-liquid interface processes

Petrik, P., Agocs, E., Kalas, B., Kozma, P., Fodor, B., Nador, J., Major, C. & Fried, M., Jan 1 2015, Optical Methods for Inspection, Characterization, and Imaging of Biomaterials II. Grilli, S., Ferraro, P., Ritsch-Marte, M. & Stifter, D. (eds.). SPIE, 95290W. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 9529).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Refractive index and interband transitions in strain modified NaNbO3 thin films grown by MOCVD

Bin Anooz, S., Petrik, P., Schmidbauer, M., Remmele, T. & Schwarzkopf, J., Sep 30 2015, In : Journal of Physics D: Applied Physics. 48, 38, 385303.

Research output: Contribution to journalArticle

1 Citation (Scopus)

Target dependent femtosecond laser plasma implantation dynamics in enabling silica for high density erbium doping

Chandrappan, J., Murray, M., Kakkar, T., Petrik, P., Agocs, E., Zolnai, Z., Steenson, D. P., Jha, A. & Jose, G., Sep 15 2015, In : Scientific reports. 5, 14037.

Research output: Contribution to journalArticle

15 Citations (Scopus)
2014

Approaches to calculate the dielectric function of ZnO around the band gap

Agocs, E., Fodor, B., Pollakowski, B., Beckhoff, B., Nutsch, A., Jank, M. & Petrik, P., Nov 28 2014, In : Thin Solid Films. 571, P3, p. 684-688 5 p.

Research output: Contribution to journalArticle

14 Citations (Scopus)

Characterization of in-depth cavity distribution after thermal annealing of helium-implanted silicon and gallium nitride

Fodor, B., Cayrel, F., Agocs, E., Alquier, D., Fried, M. & Petrik, P., Nov 28 2014, In : Thin Solid Films. 571, P3, p. 567-572 6 p.

Research output: Contribution to journalArticle

2 Citations (Scopus)

Composite polymeric-inorganic waveguide fabricated by injection molding for biosensing applications

Dortu, F., Bernier, D., Cestier, I., Vandormael, D., Emmerechts, C., Fissi, L. E., Francis, L., Nittler, L., Houssiau, L., Fodor, B., Agocs, E., Petrik, P. & Fried, M., 2014, ICTON 2014 - 16th International Conference on Transparent Optical Networks. IEEE Computer Society, 6876325. (International Conference on Transparent Optical Networks).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Enabling silica for high density rare earth doping for integrated optoelectronic systems

Chandrappan, J., Murray, M., Petrik, P., Agocs, E., Zolnai, Z., Steenson, D. P., Jha, A. & Jose, G., Jul 21 2014, European Conference on Lasers and Electro-Optics, CLEO 2015. OSA - The Optical Society

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

High-speed imaging/mapping spectroscopic ellipsometry for in-line analysis of roll-to-roll thin-film photovoltaics

Shan, A., Fried, M., Juhász, G., Major, C., Polgár, O., Németh, Á., Petrik, P., Dahal, L. R., Chen, J., Huang, Z., Podraza, N. J. & Collins, R. W., Jan 2014, In : IEEE Journal of Photovoltaics. 4, 1, p. 355-361 7 p., 6644259.

Research output: Contribution to journalArticle

24 Citations (Scopus)

Measurement comparison of goniometric scatterometry and coherent Fourier scatterometry

Endres, J., Kumar, N., Petrik, P., Henn, M. A., Heidenreich, S., Pereira, S. F., Urbach, H. P. & Bodermann, B., Jan 1 2014, Optical Micro- and Nanometrology V. SPIE, 913208. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 9132).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Optical analysis of room temperature magnetron sputtered ITO films by reflectometry and spectroscopic ellipsometry

Lohner, T., Kumar, K. J., Petrik, P., Subrahmanyam, A. & Bársony, I., Jul 28 2014, In : Journal of Materials Research. 29, 14, p. 1528-1536 9 p.

Research output: Contribution to journalArticle

15 Citations (Scopus)

Optical characterization of gold-cuprous oxide interfaces for terahertz emission applications

Ramanandan, G. K. P., Adam, A. J. L., Ramakrishnan, G., Petrik, P., Hendrikx, R. & Planken, P. C. M., Apr 1 2014, In : Applied Optics. 10, p. 1994-2000 7 p.

Research output: Contribution to journalArticle

2 Citations (Scopus)

Optical characterization of laterally and vertically structured oxides and semiconductors

Petrik, P., Kumar, N., Agocs, E., Fodor, B., Pereira, S. F., Lohner, T., Fried, M. & Urbach, H. P., 2014, Oxide-Based Materials and Devices V. SPIE, 89870E. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 8987).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Optical characterization of macro-, micro- and nanostructures using polarized light

Petrik, P., Kumar, N., Juhasz, G., Major, C., Fodor, B., Agocs, E., Lohner, T., Pereira, S. F., Urbach, H. P. & Fried, M., 2014, In : Journal of Physics: Conference Series. 558, 1, 012008.

Research output: Contribution to journalConference article

6 Citations (Scopus)

Optical characterization of patterned thin films

Rosu, D., Petrik, P., Rattmann, G., Schellenberger, M., Beck, U. & Hertwig, A., Nov 28 2014, In : Thin Solid Films. 571, P3, p. 601-604 4 p.

Research output: Contribution to journalArticle

2 Citations (Scopus)

Optical polymers with tunable refractive index for nanoimprint technologies

Landwehr, J., Fader, R., Rumler, M., Rommel, M., Bauer, A. J., Frey, L., Simon, B., Fodor, B., Petrik, P., Schiener, A., Winter, B. & Spiecker, E., Dec 19 2014, In : Nanotechnology. 25, 50, 505301.

Research output: Contribution to journalArticle

4 Citations (Scopus)

Parameterization of the dielectric function of semiconductor nanocrystals

Petrik, P., 2014, In : Physica B: Condensed Matter. 453, p. 2-7 6 p.

Research output: Contribution to journalArticle

13 Citations (Scopus)