• 1282 Citations
  • 19 h-Index
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Fingerprint Dive into the research topics where P. Petrik is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 34 Similar Profiles
ellipsometry Physics & Astronomy
Spectroscopic ellipsometry Engineering & Materials Science
Ellipsometry Engineering & Materials Science
Silicon Chemical Compounds
Ion implantation Engineering & Materials Science
ion implantation Physics & Astronomy
Rutherford backscattering spectroscopy Engineering & Materials Science
backscattering Physics & Astronomy

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Research Output 1996 2019

  • 1282 Citations
  • 19 h-Index
  • 127 Article
  • 39 Conference contribution
  • 2 Chapter

Changes in composite nc-Si-SiO2 thin films caused by 20 MeV electron irradiation

Nesheva, D., Petrik, P., Hristova-Vasileva, T., Fogarassy, Z., Kalas, B., Šćepanović, M., Kaschieva, S., Dmitriev, S. N. & Antonova, K., Jan 1 2019, In : Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms.

Research output: Contribution to journalArticle

Electron irradiation
electron irradiation
Composite films
Thin films
composite materials

In Situ Characterization of Biomaterials at Solid-Liquid Interfaces Using Ellipsometry in the UV-Visible-NIR Wavelength Range

Kalas, B., Agocs, E., Romanenko, A. & Petrik, P., Jan 1 2019, (Accepted/In press) In : Physica Status Solidi (A) Applications and Materials Science. 1800762.

Research output: Contribution to journalArticle

Biocompatible Materials
liquid-solid interfaces

Optical Properties of Oxidized, Hydrogenated, and Native Zirconium Surfaces for Wavelengths from 0.3 to 25 µm − A Study by Ex Situ and In Situ Spectroscopic Ellipsometry

Petrik, P., Romanenko, A., Kalas, B., Péter, L., Novotny, T., Perez-Feró, E., Fodor, B., Agocs, E., Lohner, T., Kurunczi, S., Stoica, M., Gartner, M. & Hózer, Z., Jan 1 2019, In : Physica Status Solidi (A) Applications and Materials Science. 1800676.

Research output: Contribution to journalArticle

Spectroscopic ellipsometry
Optical properties