• 1896 Citations
  • 21 h-Index
1982 …2020

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Editorial
2013

Special issue on "current Trends in Optical and X-Ray Metrology of Advanced Materials for Nanoscale Devices III", E-MRS Spring 2012 - Symposium W, held in Strasbourg, France, May 14-18, 2012

Modreanu, M., Durand, O., Jellison, G. E., Salviati, G. & Fried, M., Aug 31 2013, In : Thin Solid Films. 541, p. 1-2 2 p.

Research output: Contribution to journalEditorial