• 579 Citations
  • 12 h-Index
1990 …2018

Research output per year

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Article
2018
2016

Defect structure and strain reduction of 3C-SiC/Si layers obtained with the use of a buffer layer and methyltrichlorosilane addition

Bosi, M., Attolini, G., Negri, M., Ferrari, C., Buffagni, E., Frigeri, C., Calicchio, M., Pécz, B., Riesz, F., Cora, I., Osváth, Z., Jiang, L. & Borionetti, G., Apr 21 2016, In : CrystEngComm. 18, 15, p. 2770-2779 10 p.

Research output: Contribution to journalArticle

6 Citations (Scopus)
2015

Thermo-mechanical design and characterization of low dissipation micro-hotplates operated above 500 °c

Biró, F., Dücso, C., Hajnal, Z., Riesz, F., Pap, A. E. & Bársony, I., Dec 12 2015, In : Microelectronics Journal. 45, 12, p. 1822-1828 7 p.

Research output: Contribution to journalArticle

10 Citations (Scopus)
2013

Non-linearity and related features of Makyoh (magic-mirror) imaging

Riesz, F., Jul 1 2013, In : Journal of Optics (United Kingdom). 15, 7, 075709.

Research output: Contribution to journalArticle

2 Citations (Scopus)
2011

Effects of speckle in Makyoh topography for the studies of extended defects

Riesz, F., Jan 1 2011, In : Journal of Physics: Conference Series. 281, 1, 012006.

Research output: Contribution to journalArticle

1 Citation (Scopus)

General spectral properties of Makyoh imaging of quasi-periodic surfaces

Riesz, F., Feb 1 2011, In : Optics and Laser Technology. 43, 1, p. 245-247 3 p.

Research output: Contribution to journalArticle

1 Citation (Scopus)

Relationship between structural changes, hydrogen content and annealing in stacks of ultrathin Si/Ge amorphous layers

Frigeri, C., Serenyi, M., Khánh, N. Q., Csik, A., Riesz, F., Erdélyi, Z., Nasi, L., Beke, D. L. & Boyen, H. G., Jan 2011, In : Nanoscale Research Letters. 6, 1, 189.

Research output: Contribution to journalArticle

7 Citations (Scopus)

Sensitivity and detectability in Makyoh imaging

Riesz, F., Jun 1 2011, In : Optik. 122, 11, p. 1005-1009 5 p.

Research output: Contribution to journalArticle

2 Citations (Scopus)

Wafer curvature analysis in 3C-SiC layers grown on (0 0 1) and (1 1 1) Si substrates

Bosi, M., Attolini, G., Watts, B. E., Rossi, F., Ferrari, C., Riesz, F. & Jiang, L., Mar 1 2011, In : Journal of Crystal Growth. 318, 1, p. 401-405 5 p.

Research output: Contribution to journalArticle

10 Citations (Scopus)
2009

Study of the influence of the rare-earth elements on the properties of lead iodide

Matuchova, M., Zdansky, K., Zavadil, J., Danilewsky, A., Riesz, F., Hassan, M. A. S., Alexiew, D. & Kral, R., Jul 1 2009, In : Journal of Crystal Growth. 311, 14, p. 3557-3562 6 p.

Research output: Contribution to journalArticle

9 Citations (Scopus)
2008

Application of MSM InP detectors to the measurement of pulsed X-ray radiation

Ryc, L., Dobrzanski, L., Dubecky, F., Kaczmarczyk, J., Pfeifer, M., Riesz, F., Słysz, W. & Surma, B., Apr 1 2008, In : Radiation Effects and Defects in Solids. 163, 4-6, p. 559-567 9 p.

Research output: Contribution to journalArticle

1 Citation (Scopus)

Makyoh-topography study of the swirl defect in Si wafers

Riesz, F., Pap, A. E., Ádám, M. & Lukács, I. E., Sep 30 2008, In : Thin Solid Films. 516, 22, p. 8087-8091 5 p.

Research output: Contribution to journalArticle

3 Citations (Scopus)

Sub-pixel detection of a grid's node positions for optical diagnostics

Lukács, I. E. & Riesz, F., Sep 30 2008, In : Thin Solid Films. 516, 22, p. 8082-8086 5 p.

Research output: Contribution to journalArticle

1 Citation (Scopus)
2007

Application of Makyoh (magic-mirror) topography in the research of artificial biomineralization

Riesz, F., Pramatarova, L., Pecheva, E. V. & Dimitrova, M., Jan 1 2007, In : Journal of Optoelectronics and Advanced Materials. 9, 1, p. 201-204 4 p.

Research output: Contribution to journalArticle

Ion implantation modified stainless steel as a substrate for hydroxyapatite deposition. Part I. Surface modification and characterization

Pramatarova, L., Pecheva, E., Krastev, V. & Riesz, F., Mar 1 2007, In : Journal of Materials Science: Materials in Medicine. 18, 3, p. 435-440 6 p.

Research output: Contribution to journalArticle

16 Citations (Scopus)
2006

A note on 'Oriental magic mirrors and the Laplacian image'

Riesz, F., Jul 1 2006, In : European Journal of Physics. 27, 4, p. N5-N7 N02.

Research output: Contribution to journalArticle

4 Citations (Scopus)

Sensitivity of Makyoh topography

Riesz, F., Feb 1 2006, In : Materials Science in Semiconductor Processing. 9, 1-3, p. 220-224 5 p.

Research output: Contribution to journalArticle

4 Citations (Scopus)
2005

An X-ray diffraction study of the structural properties of thick relaxed (100) InGaAs/GaAs heterostructures

Riesz, F., Domagala, J. Z. & Nemcsics, Á., Nov 8 2005, In : Physica Status Solidi C: Conferences. 2, 4, p. 1298-1303 6 p.

Research output: Contribution to journalArticle

Hydroxyapatite growth on glass/CdSe/SiOx nanostructures

Pramatarova, L., Pecheva, E., Nesheva, D., Aneva, Z., Toth, A. L., EHorvath & Riesz, F., Jan 1 2005, In : Solid State Phenomena. 106, p. 123-126 4 p.

Research output: Contribution to journalArticle

2 Citations (Scopus)

Sensitivity and measurement errors of Makyoh topography

Riesz, F. & Lukács, I. E., Mar 1 2005, In : Physica Status Solidi (A) Applications and Materials Science. 202, 4, p. 584-589 6 p.

Research output: Contribution to journalArticle

1 Citation (Scopus)
2004

Effect of crystal defects on the electrical behaviour of InP and SiGe epitaxial structures

Horváth, Z. J., Orlov, L. K., Rakovics, V., Ivina, N. L., Tóth, A. L., Demidov, E. S., Riesz, F., Vdovin, V. I. & Pászti, Z., Jul 1 2004, In : EPJ Applied Physics. 27, 1-3, p. 189-192 4 p.

Research output: Contribution to journalArticle

2 Citations (Scopus)

Error analysis of Makyoh-topography surface height profile measurements

Lukács, I. E. & Riesz, F., Jul 1 2004, In : EPJ Applied Physics. 27, 1-3, p. 385-388 4 p.

Research output: Contribution to journalArticle

2 Citations (Scopus)
2003

High spatial resolution Makyoh topography using shifted grid illumination

Lukács, I. E., Riesz, F. & Laczik, Z. J., Jan 1 2003, In : Physica Status Solidi (A) Applied Research. 195, 1 SPEC, p. 271-276 6 p.

Research output: Contribution to journalArticle

6 Citations (Scopus)

Makyoh topography: A simple yet powerful optical method for surface flatness and defect characterisation

Riesz, F., Jan 1 2003, In : Defect and Diffusion Forum. 221-223, p. 51-61 11 p.

Research output: Contribution to journalArticle

1 Citation (Scopus)

Makyoh-topography assessment of etch and polish removal of processed circuits for substrate re-use

Lukács, I. E. & Riesz, F., May 1 2003, In : Microelectronic Engineering. 65, 4, p. 380-386 7 p.

Research output: Contribution to journalArticle

5 Citations (Scopus)
2002

Determination of deformation induced by thin film residual stress in structures of millimeter size

Lukács, I. E., Vízváry, Z., Fürjes, P., Riesz, F., Dücsö, C. & Bársony, I., Aug 1 2002, In : Advanced Engineering Materials. 4, 8, p. 625-627 3 p.

Research output: Contribution to journalArticle

9 Citations (Scopus)
3 Citations (Scopus)

Makyoh-topography studies of the morphology of the cross sections of renal stones

Riesz, F., Pramatarova, L. D., Pramatarova, R. & Tóth, A. L., Nov 1 2002, In : Journal of Crystal Growth. 245, 1-2, p. 101-108 8 p.

Research output: Contribution to journalArticle

4 Citations (Scopus)
2001

Application of Makyoh topography for the study of GaAs layers grown by epitaxial lateral overgrowth

Riesz, F. & Zytkiewicz, Z. R., Feb 2001, In : Journal of Crystal Growth. 222, 4, p. 741-746 6 p.

Research output: Contribution to journalArticle

2 Citations (Scopus)

Imaging-limiting effects of apertures in Makyoh-topography instruments

Lukács, I. E. & Riesz, F., Aug 2001, In : Measurement Science and Technology. 12, 8, p. N29-N33

Research output: Contribution to journalArticle

23 Citations (Scopus)
7 Citations (Scopus)
12 Citations (Scopus)
2000

Geometrical optical model of the image formation in Makyoh (magic-mirror) topography

Riesz, F., Dec 7 2000, In : Journal of Physics D: Applied Physics. 33, 23, p. 3033-3040 8 p.

Research output: Contribution to journalArticle

37 Citations (Scopus)

Makyoh-topography study of grooves scratched and etched in single-crystal semiconductors

Riesz, F., Dec 2000, In : Materials Letters. 46, 5, p. 291-295 5 p.

Research output: Contribution to journalArticle

4 Citations (Scopus)
1999

Carrier profiling of a heterojunction bipolar transistor and p-i-n photodiode structures by electrochemical C-V technique

Kinder, R., Nemcsics, Á., Harman, R., Riesz, F. & Pécz, B., Oct 1 1999, In : Physica Status Solidi (A) Applied Research. 175, 2, p. 631-636 6 p.

Research output: Contribution to journalArticle

12 Citations (Scopus)

Makyoh topography for the study of large-area extended defects in semiconductors

Riesz, F., Jan 1 1999, In : Physica Status Solidi (A) Applied Research. 171, 1, p. 403-409 7 p.

Research output: Contribution to journalArticle

10 Citations (Scopus)

Potential application of the AIGaAs/GaAs heterostructure photodiodes for laser-plasma diagnostics

Ryć, L. & Riesz, F., Dec 1 1999, In : Nukleonika. 44, 4, p. 647-656 10 p.

Research output: Contribution to journalArticle

Selective electrochemical profiling of threading defects in mismatched heteroepitaxial systems

Nemcsics, Á., Riesz, F. & Dobos, L., Jan 1 1999, In : Thin Solid Films. 343-344, 1-2, p. 520-523 4 p.

Research output: Contribution to journalArticle

6 Citations (Scopus)
1 Citation (Scopus)

The EBIC study of boundary effects in the Si PIN photodiodes for X-ray detector applications

Riesz, F., Tóth, A. L., Ryć, L., Słysz, W. & Wȩgrzecki, M., Dec 1 1999, In : Nukleonika. 44, 4, p. 635-646 12 p.

Research output: Contribution to journalArticle

2 Citations (Scopus)
1998

An atomic force microscopy study of the surface morphology of InP/GaAs heteroepitaxial layers subjected to rapid thermal annealing

Riesz, F., Vignali, C., Pelosi, C., Rakennus, K. & Hakkarainen, T., Jan 1 1998, In : Journal of Applied Physics. 83, 1, p. 246-249 4 p.

Research output: Contribution to journalArticle

5 Citations (Scopus)

Mapping of Bragg-surface diffraction of InP/GaAs(1 0 0) structure

Avanci, L. H., Hayashi, M. A., Cardoso, L. P., Morelhão, S. L., Riesz, F., Rakennus, K. & Hakkarainen, T., Jun 1 1998, In : Journal of Crystal Growth. 188, 1-4, p. 220-224 5 p.

Research output: Contribution to journalArticle

6 Citations (Scopus)

Room temperature persistent photoconductivity in GaP:S

Zardas, G. E., Theodorou, D. E., Euthymiou, P. C., Symeonides, C. I., Riesz, F. & Szentpall, B., Jan 1998, In : Solid State Communications. 105, 2, p. 77-79 3 p.

Research output: Contribution to journalArticle

10 Citations (Scopus)
17 Citations (Scopus)
1997

A transient method for measuring current-voltage characteristics with negative differential resistance regions

Dózsa, L., Riesz, F., Karányi, J., Van Tuyen, V., Szentpáli, B. & Muller, A., Sep 1997, In : Physica Status Solidi (A) Applied Research. 163, 1, p. R1-R2

Research output: Contribution to journalArticle

4 Citations (Scopus)
1996
32 Citations (Scopus)

Crystallographic tilting in lattice-mismatched heteroepitaxy: A Dodson-Tsao relaxation approach

Riesz, F., Apr 15 1996, In : Journal of Applied Physics. 79, 8, p. 4111-4117 7 p.

Research output: Contribution to journalArticle

22 Citations (Scopus)
2 Citations (Scopus)