• 579 Citations
  • 12 h-Index
1990 …2018

Research output per year

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Research Output

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Conference contribution
2012

Application of single-crystal CVD diamond and SiC detectors for diagnostics of ion emission from laser plasmas

Ryc, L., Calcagno, L., Dubecky, F., Margarone, D., Nowak, T., Parys, P., Pfeifer, M., Riesz, F. & Torrisi, L., Dec 1 2012, ASDAM 2012 - Conference Proceedings: The 9th International Conference on Advanced Semiconductor Devices and Microsystems. p. 255-258 4 p. 6418519. (ASDAM 2012 - Conference Proceedings: The 9th International Conference on Advanced Semiconductor Devices and Microsystems).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)
2011

Coherence effects in Makyoh topography

Riesz, F., Dec 1 2011, Optical Measurement Systems for Industrial Inspection VII. 80822I. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 8082).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Evaluation of curvature and stress in 3C-SiC grown on differently oriented Si substrates

Watts, B. E., Attolini, G., Besagni, T., Bosi, M., Ferrari, C., Rossi, F., Riesz, F. & Jiang, L., Apr 28 2011, Silicon Carbide and Related Materials 2010. p. 137-140 4 p. (Materials Science Forum; vol. 679-680).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)
2009

A comparative study of the morphology of 3C-SiC grown at different C/Si ratios

Attolini, G., Watts, B. E., Bosi, M., Rossi, F. & Riesz, F., Dec 1 2009, Silicon Carbide and Related Materials 2008: ECSCRM 2008. p. 153-156 4 p. (Materials Science Forum; vol. 615 617).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

A study of the morphology of 3C-SiC layers grown at different C/Si ratios

Attolini, G., Watts, B. E., Bosi, M., Rossi, F. & Riesz, F., Dec 1 2009, ECS Transactions - Analytical Techniques for Semiconductor Materials and Process Characterization 6, ALTECH 2009. 3 ed. p. 397-401 5 p. (ECS Transactions; vol. 25, no. 3).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Makyoh-topography studies of the morphology of periodic and quasi-periodic surfaces

Riesz, F., Sep 14 2009, Optical Measurement Systems for Industrial Inspection VI. 73892M. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 7389).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2007

Realisation of quantitative Makyoh topography using a digital micromirror device

Riesz, F., Lukács, I. E. & Makai, J. P., Nov 23 2007, Optical Measurement Systems for Industrial Inspection V. PART 1 ed. 66160L. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 6616, no. PART 1).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)
2004

Fast MSM InP detectors for measurement of X-ray emission from laser plasmas

Ryć, L., Dubecký, F., Kozłowska, A., Krása, J., Králikowa, B., Pfeifer, M., Parys, P., Pura, B., Riesz, F., Rohlena, K., Skála, J. & Ullschmied, J., Dec 1 2004, ASDAM 2004 - Conference Proceedings, 5th International Conference on Semiconductor Devices and Microsystmes. Osvald, J., Hascik, S., Osvald, J. & Hascik, S. (eds.). p. 183-186 4 p. (ASDAM 2004 - Conference Proceedings, 5th International Conference on Semiconductor Devices and Microsystmes).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2000

Possibilities of quantitative Makyoh topography

Riesz, F. & Lukács, I. E., Jan 1 2000, ASDAM 2000 - Conference Proceedings: 3rd International EuroConference on Advanced Semiconductor Devices and Microsystems. Kuzmik, J., Osvald, J., Hascik, S. & Breza, J. (eds.). Institute of Electrical and Electronics Engineers Inc., p. 215-218 4 p. 889484. (ASDAM 2000 - Conference Proceedings: 3rd International EuroConference on Advanced Semiconductor Devices and Microsystems).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)
1998

A contribution to electrochemical C-V measurements on GaAs/GaAlAs multilayer structures

Kinder, R., Nemcsics, A., Harman, R., Riesz, F. & Pécz, B., Jan 1 1998, ASDAM 1998 Conference Proceedings: 2nd International Conference on Advanced Semiconductor Devices And Microsystems. Uherek, F., Drobny, V., Breza, J. & Donoval, D. (eds.). Institute of Electrical and Electronics Engineers Inc., Vol. 1998-October. p. 215-218 4 p. 730202

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Surface-oriented and bulk GaAs and InP detectors for X-ray diagnostics of laser plasmas

Ryc, L., Riesz, F., Pfeifer, M. & Korobkin, Y. V., Jan 1 1998, ASDAM 1998 Conference Proceedings: 2nd International Conference on Advanced Semiconductor Devices And Microsystems. Uherek, F., Drobny, V., Breza, J. & Donoval, D. (eds.). Institute of Electrical and Electronics Engineers Inc., Vol. 1998-October. p. 187-190 4 p. 730195

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)