• 579 Citations
  • 12 h-Index
1990 …2018

Research output per year

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Research Output

2018
2016

Defect structure and strain reduction of 3C-SiC/Si layers obtained with the use of a buffer layer and methyltrichlorosilane addition

Bosi, M., Attolini, G., Negri, M., Ferrari, C., Buffagni, E., Frigeri, C., Calicchio, M., Pécz, B., Riesz, F., Cora, I., Osváth, Z., Jiang, L. & Borionetti, G., Apr 21 2016, In : CrystEngComm. 18, 15, p. 2770-2779 10 p.

Research output: Contribution to journalArticle

6 Citations (Scopus)
2015

Thermo-mechanical design and characterization of low dissipation micro-hotplates operated above 500 °c

Biró, F., Dücso, C., Hajnal, Z., Riesz, F., Pap, A. E. & Bársony, I., Dec 12 2015, In : Microelectronics Journal. 45, 12, p. 1822-1828 7 p.

Research output: Contribution to journalArticle

10 Citations (Scopus)
2014

Measurement of ion emission from plasmas obtained with a 600 fs KrF laser

Ryć, L., Barna, A., Calcagno, L., Földes, I. B., Parys, P., Riesz, F., Rosiński, M., Szatmári, S. & Torrisi, L., Jan 1 2014, In : Physica Scripta. T161, 014032.

Research output: Contribution to journalConference article

3 Citations (Scopus)

Membrane platforms for sensors

Bársony, I., Dücso, C., Fürjes, P., Riesz, F., Hajnal, Z. & Battistig, G., Jan 1 2014, In : Procedia Engineering. 87, p. 871-878 8 p.

Research output: Contribution to journalConference article

Open Access
3 Citations (Scopus)
2013

Non-linearity and related features of Makyoh (magic-mirror) imaging

Riesz, F., Jul 1 2013, In : Journal of Optics (United Kingdom). 15, 7, 075709.

Research output: Contribution to journalArticle

2 Citations (Scopus)
2012

Application of single-crystal CVD diamond and SiC detectors for diagnostics of ion emission from laser plasmas

Ryc, L., Calcagno, L., Dubecky, F., Margarone, D., Nowak, T., Parys, P., Pfeifer, M., Riesz, F. & Torrisi, L., Dec 1 2012, ASDAM 2012 - Conference Proceedings: The 9th International Conference on Advanced Semiconductor Devices and Microsystems. p. 255-258 4 p. 6418519. (ASDAM 2012 - Conference Proceedings: The 9th International Conference on Advanced Semiconductor Devices and Microsystems).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)
2011

Coherence effects in Makyoh topography

Riesz, F., Dec 1 2011, Optical Measurement Systems for Industrial Inspection VII. 80822I. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 8082).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Effects of speckle in Makyoh topography for the studies of extended defects

Riesz, F., Jan 1 2011, In : Journal of Physics: Conference Series. 281, 1, 012006.

Research output: Contribution to journalArticle

1 Citation (Scopus)

Evaluation of curvature and stress in 3C-SiC grown on differently oriented Si substrates

Watts, B. E., Attolini, G., Besagni, T., Bosi, M., Ferrari, C., Rossi, F., Riesz, F. & Jiang, L., Apr 28 2011, Silicon Carbide and Related Materials 2010. p. 137-140 4 p. (Materials Science Forum; vol. 679-680).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

General spectral properties of Makyoh imaging of quasi-periodic surfaces

Riesz, F., Feb 1 2011, In : Optics and Laser Technology. 43, 1, p. 245-247 3 p.

Research output: Contribution to journalArticle

1 Citation (Scopus)

Relationship between structural changes, hydrogen content and annealing in stacks of ultrathin Si/Ge amorphous layers

Frigeri, C., Serenyi, M., Khánh, N. Q., Csik, A., Riesz, F., Erdélyi, Z., Nasi, L., Beke, D. L. & Boyen, H. G., Jan 2011, In : Nanoscale Research Letters. 6, 1, 189.

Research output: Contribution to journalArticle

7 Citations (Scopus)

Sensitivity and detectability in Makyoh imaging

Riesz, F., Jun 1 2011, In : Optik. 122, 11, p. 1005-1009 5 p.

Research output: Contribution to journalArticle

2 Citations (Scopus)

Wafer curvature analysis in 3C-SiC layers grown on (0 0 1) and (1 1 1) Si substrates

Bosi, M., Attolini, G., Watts, B. E., Rossi, F., Ferrari, C., Riesz, F. & Jiang, L., Mar 1 2011, In : Journal of Crystal Growth. 318, 1, p. 401-405 5 p.

Research output: Contribution to journalArticle

10 Citations (Scopus)
2009

A comparative study of the morphology of 3C-SiC grown at different C/Si ratios

Attolini, G., Watts, B. E., Bosi, M., Rossi, F. & Riesz, F., Dec 1 2009, Silicon Carbide and Related Materials 2008: ECSCRM 2008. p. 153-156 4 p. (Materials Science Forum; vol. 615 617).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

A study of the morphology of 3C-SiC layers grown at different C/Si ratios

Attolini, G., Watts, B. E., Bosi, M., Rossi, F. & Riesz, F., Dec 1 2009, ECS Transactions - Analytical Techniques for Semiconductor Materials and Process Characterization 6, ALTECH 2009. 3 ed. p. 397-401 5 p. (ECS Transactions; vol. 25, no. 3).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Makyoh topography for the studies of extended defects: Possibilities and limitations

Riesz, F., Dec 7 2009, In : Physica Status Solidi (C) Current Topics in Solid State Physics. 6, 8, p. 1948-1952 5 p.

Research output: Contribution to journalConference article

1 Citation (Scopus)

Makyoh-topography studies of the morphology of periodic and quasi-periodic surfaces

Riesz, F., Sep 14 2009, Optical Measurement Systems for Industrial Inspection VI. 73892M. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 7389).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Study of the influence of the rare-earth elements on the properties of lead iodide

Matuchova, M., Zdansky, K., Zavadil, J., Danilewsky, A., Riesz, F., Hassan, M. A. S., Alexiew, D. & Kral, R., Jul 1 2009, In : Journal of Crystal Growth. 311, 14, p. 3557-3562 6 p.

Research output: Contribution to journalArticle

9 Citations (Scopus)
2008

Application of MSM InP detectors to the measurement of pulsed X-ray radiation

Ryc, L., Dobrzanski, L., Dubecky, F., Kaczmarczyk, J., Pfeifer, M., Riesz, F., Słysz, W. & Surma, B., Apr 1 2008, In : Radiation Effects and Defects in Solids. 163, 4-6, p. 559-567 9 p.

Research output: Contribution to journalArticle

1 Citation (Scopus)

Makyoh-topography study of the swirl defect in Si wafers

Riesz, F., Pap, A. E., Ádám, M. & Lukács, I. E., Sep 30 2008, In : Thin Solid Films. 516, 22, p. 8087-8091 5 p.

Research output: Contribution to journalArticle

3 Citations (Scopus)

Sub-pixel detection of a grid's node positions for optical diagnostics

Lukács, I. E. & Riesz, F., Sep 30 2008, In : Thin Solid Films. 516, 22, p. 8082-8086 5 p.

Research output: Contribution to journalArticle

1 Citation (Scopus)
2007

Application of Makyoh (magic-mirror) topography in the research of artificial biomineralization

Riesz, F., Pramatarova, L., Pecheva, E. V. & Dimitrova, M., Jan 1 2007, In : Journal of Optoelectronics and Advanced Materials. 9, 1, p. 201-204 4 p.

Research output: Contribution to journalArticle

Ion implantation modified stainless steel as a substrate for hydroxyapatite deposition. Part I. Surface modification and characterization

Pramatarova, L., Pecheva, E., Krastev, V. & Riesz, F., Mar 1 2007, In : Journal of Materials Science: Materials in Medicine. 18, 3, p. 435-440 6 p.

Research output: Contribution to journalArticle

16 Citations (Scopus)

Realisation of quantitative Makyoh topography using a digital micromirror device

Riesz, F., Lukács, I. E. & Makai, J. P., Nov 23 2007, Optical Measurement Systems for Industrial Inspection V. PART 1 ed. 66160L. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 6616, no. PART 1).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)
2006

A note on 'Oriental magic mirrors and the Laplacian image'

Riesz, F., Jul 1 2006, In : European Journal of Physics. 27, 4, p. N5-N7 N02.

Research output: Contribution to journalArticle

4 Citations (Scopus)

Sensitivity of Makyoh topography

Riesz, F., Feb 1 2006, In : Materials Science in Semiconductor Processing. 9, 1-3, p. 220-224 5 p.

Research output: Contribution to journalArticle

4 Citations (Scopus)
2005

An X-ray diffraction study of the structural properties of thick relaxed (100) InGaAs/GaAs heterostructures

Riesz, F., Domagala, J. Z. & Nemcsics, Á., Nov 8 2005, In : Physica Status Solidi C: Conferences. 2, 4, p. 1298-1303 6 p.

Research output: Contribution to journalArticle

Hydroxyapatite growth on glass/CdSe/SiOx nanostructures

Pramatarova, L., Pecheva, E., Nesheva, D., Aneva, Z., Toth, A. L., EHorvath & Riesz, F., Jan 1 2005, In : Solid State Phenomena. 106, p. 123-126 4 p.

Research output: Contribution to journalArticle

2 Citations (Scopus)

Sensitivity and measurement errors of Makyoh topography

Riesz, F. & Lukács, I. E., Mar 1 2005, In : Physica Status Solidi (A) Applications and Materials Science. 202, 4, p. 584-589 6 p.

Research output: Contribution to journalArticle

1 Citation (Scopus)
2004

Effect of crystal defects on the electrical behaviour of InP and SiGe epitaxial structures

Horváth, Z. J., Orlov, L. K., Rakovics, V., Ivina, N. L., Tóth, A. L., Demidov, E. S., Riesz, F., Vdovin, V. I. & Pászti, Z., Jul 1 2004, In : EPJ Applied Physics. 27, 1-3, p. 189-192 4 p.

Research output: Contribution to journalArticle

2 Citations (Scopus)

Error analysis of Makyoh-topography surface height profile measurements

Lukács, I. E. & Riesz, F., Jul 1 2004, In : EPJ Applied Physics. 27, 1-3, p. 385-388 4 p.

Research output: Contribution to journalArticle

2 Citations (Scopus)

Fast MSM InP detectors for measurement of X-ray emission from laser plasmas

Ryć, L., Dubecký, F., Kozłowska, A., Krása, J., Králikowa, B., Pfeifer, M., Parys, P., Pura, B., Riesz, F., Rohlena, K., Skála, J. & Ullschmied, J., Dec 1 2004, ASDAM 2004 - Conference Proceedings, 5th International Conference on Semiconductor Devices and Microsystmes. Osvald, J., Hascik, S., Osvald, J. & Hascik, S. (eds.). p. 183-186 4 p. (ASDAM 2004 - Conference Proceedings, 5th International Conference on Semiconductor Devices and Microsystmes).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

26 Citations (Scopus)
2003

High spatial resolution Makyoh topography using shifted grid illumination

Lukács, I. E., Riesz, F. & Laczik, Z. J., Jan 1 2003, In : Physica Status Solidi (A) Applied Research. 195, 1 SPEC, p. 271-276 6 p.

Research output: Contribution to journalArticle

6 Citations (Scopus)

Interpretation of the depth-dependent etch pit density in InGaAs/GaAs heterostructures

Nemcsics, Á. & Riesz, F., Dec 1 2003, In : Physica Status Solidi C: Conferences. 3, p. 893-896 4 p.

Research output: Contribution to journalConference article

1 Citation (Scopus)

Makyoh topography: A simple yet powerful optical method for surface flatness and defect characterisation

Riesz, F., Jan 1 2003, In : Defect and Diffusion Forum. 221-223, p. 51-61 11 p.

Research output: Contribution to journalArticle

1 Citation (Scopus)

Makyoh-topography assessment of etch and polish removal of processed circuits for substrate re-use

Lukács, I. E. & Riesz, F., May 1 2003, In : Microelectronic Engineering. 65, 4, p. 380-386 7 p.

Research output: Contribution to journalArticle

5 Citations (Scopus)
2002

Determination of deformation induced by thin film residual stress in structures of millimeter size

Lukács, I. E., Vízváry, Z., Fürjes, P., Riesz, F., Dücsö, C. & Bársony, I., Aug 1 2002, In : Advanced Engineering Materials. 4, 8, p. 625-627 3 p.

Research output: Contribution to journalArticle

9 Citations (Scopus)

Evaluation of GaAs and InP MSM detectors for detection of pulsed X-ray emission from laser plasmas

Ryć, L., Dubecký, F., Pfeifer, M., Pura, B., Riesz, F. & Slysz, W., Dec 1 2002, p. 280-283. 4 p.

Research output: Contribution to conferencePaper

1 Citation (Scopus)
3 Citations (Scopus)

Makyoh-topography studies of the morphology of the cross sections of renal stones

Riesz, F., Pramatarova, L. D., Pramatarova, R. & Tóth, A. L., Nov 1 2002, In : Journal of Crystal Growth. 245, 1-2, p. 101-108 8 p.

Research output: Contribution to journalArticle

4 Citations (Scopus)
2001

Application of Makyoh topography for the study of GaAs layers grown by epitaxial lateral overgrowth

Riesz, F. & Zytkiewicz, Z. R., Feb 2001, In : Journal of Crystal Growth. 222, 4, p. 741-746 6 p.

Research output: Contribution to journalArticle

2 Citations (Scopus)

A simple algorithm for the reconstruction of surface topography from Makyoh-topography images

Lukács, I. E. & Riesz, F., Dec 3 2001, In : Crystal Research and Technology. 36, 8-10, p. 1059-1064 6 p.

Research output: Contribution to journalConference article

3 Citations (Scopus)

Camera length and field of view in Makyoh-topography instruments

Riesz, F., Feb 1 2001, In : Review of Scientific Instruments. 72, 2, p. 1591-1593 3 p.

Research output: Contribution to journalConference article

12 Citations (Scopus)

Imaging-limiting effects of apertures in Makyoh-topography instruments

Lukács, I. E. & Riesz, F., Aug 2001, In : Measurement Science and Technology. 12, 8, p. N29-N33

Research output: Contribution to journalArticle

Influence of lattice mismatch and growth rate on the decay of RHEED oscillation in the case of InGaAs/GaAs growth

Nemcsics, Á. & Riesz, F., Dec 3 2001, In : Crystal Research and Technology. 36, 8-10, p. 1011-1017 7 p.

Research output: Contribution to journalConference article

23 Citations (Scopus)
7 Citations (Scopus)
12 Citations (Scopus)