• 7278 Citations
  • 43 h-Index
19952020

Research output per year

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Accurate Gap Levels and Their Role in the Reliability of Other Calculated Defect Properties

Deák, P., Gali, A., Aradi, B. & Frauenheim, T., Jun 18 2011, Advanced Calculations for Defects in Materials: Electronic Structure Methods. Wiley-VCH, p. 139-154 16 p.

Research output: Chapter in Book/Report/Conference proceedingChapter

Color centers in diamond for quantum applications

Thiering, G. & Gali, A., Jan 1 2020, (Accepted/In press) Semiconductors and Semimetals. Academic Press Inc., (Semiconductors and Semimetals).

Research output: Chapter in Book/Report/Conference proceedingChapter

Identification of Intrinsic Defects in SiC: Towards an Understanding of Defect Aggregates by Combining Theoretical and Experimental Approaches

Bockstedte, M., Gali, A., Mattausch, A., Pankratov, O. & Steeds, J. W., Apr 28 2011, Silicon Carbide. Wiley-VCH, Vol. 1. p. 115-145 31 p.

Research output: Chapter in Book/Report/Conference proceedingChapter

Time-Dependent Density Functional Study on the Excitation Spectrum of Point Defects in Semiconductors

Gali, A., Jun 18 2011, Advanced Calculations for Defects in Materials: Electronic Structure Methods. Wiley-VCH, p. 341-358 18 p.

Research output: Chapter in Book/Report/Conference proceedingChapter